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High and low temperature impact test device

An impact test, high and low temperature technology, applied in measuring devices, instruments, scientific instruments, etc., can solve the problems of complicated process, difficult operation, low efficiency and so on

Pending Publication Date: 2021-06-29
CHINA AIRPLANT STRENGTH RES INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] At present, when conducting high and low temperature impact tests, most of the test pieces are alternately placed in a high-temperature heating box and a low-temperature cooling box for heating and cooling. The process is complicated, the operation is difficult, the efficiency is low, and the heating and cooling rates cannot be well controlled.

Method used

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  • High and low temperature impact test device
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Embodiment Construction

[0035] In order to make the technical solution of the present application and its advantages clearer, the technical solution of the present application will be further clearly and completely described in detail below in conjunction with the accompanying drawings. It can be understood that the specific embodiments described here are only part of the application Examples are only used to explain the present application, not to limit the present application. It should be noted that, for the convenience of description, only the parts related to the present application are shown in the drawings, and other relevant parts can refer to the general design. In the case of no conflict, the embodiments in the application and the technologies in the embodiments Features can be combined with each other to obtain new embodiments.

[0036] In addition, unless otherwise defined, the technical terms or scientific terms used in the description of the application shall have the usual meanings und...

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Abstract

The invention belongs to the technical field of high and low temperature impact test design, and particularly relates to a high and low temperature impact test device. The device comprises: a supporting cylinder; a heating source which is arranged on the outer side of the supporting cylinder; two end covers, wherein each end cover is correspondingly connected to one end of the supporting cylinder, a plurality of impact holes are formed in one end cover, and each impact hole is communicated with the interior of the supporting cylinder; a cover plate, wherein a liquid nitrogen inflow hole and a high-pressure air inflow hole are formed in the cover plate, the cover plate is connected to the outer wall of the end cover with the multiple impact holes, a mixing cavity is formed between the cover plate and the end cover, and the mixing cavity is communicated with the impact holes, the liquid nitrogen inflow hole and the high-pressure air inflow hole.

Description

technical field [0001] The application belongs to the technical field of high and low temperature impact test design, and in particular relates to a high and low temperature impact test device. Background technique [0002] At present, when conducting high and low temperature impact tests, most of the test pieces are alternately placed in a high-temperature heating box and a low-temperature cooling box for heating and cooling. The process is complicated, the operation is difficult, the efficiency is low, and the heating and cooling rates cannot be well controlled. . [0003] In view of the existence of above-mentioned technical defect, propose this application. [0004] It should be noted that the disclosure of the above background technical content is only used to assist in understanding the inventive concepts and technical solutions of the present invention, and it does not necessarily belong to the prior art of this patent application. When the filing date has been publ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/60G01N3/02
CPCG01N3/60G01N3/02
Inventor 魏广平刘志民
Owner CHINA AIRPLANT STRENGTH RES INST
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