Scintillation material transient process characterization system and method based on laser pumping detection

Abstract

The invention discloses a scintillation material transient process characterization system and method based on laser pumping detection. The system comprises a femtosecond laser, a frequency tripling generator, a delay line, a chopper, a balance detector and a lock-in amplifier, the system is based on the laser pumping detection principle, fundamental frequency light and triple frequency light of a femtosecond laser are used as detection light and pumping light respectively, diagnosis and characterization of the carrier dynamic process in the ps time scale after a scintillation material is excited are achieved through light path design, and the problem of time measurement limit of a conventional photoelectric measurement method is solved.

Description

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AI Technical Summary

Benefits of technology

This patented technology uses an optical technique called pumps that detects when certain substances (scents) have been excited by radiation). It also measures how long they last before being observed with another type of stimulus - their movement or activity inside them. By measuring these changes over time, this technology allows us to study different aspects related to the structure-activity relationship between specific compounds and other factors like temperature.

Problems solved by technology

This patented technical problem addressed in the patents relates to finding better ways to improve the accuracy or resolution of measuring small amounts of radiation emitted from scintilators without affecting their ability to accurately identify large changes over time.

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