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A testing method, device, electronic equipment and storage medium of an audio chip

An audio chip and test method technology, applied in the field of data processing, can solve the problems of consumption, the test method of the audio chip cannot meet the user's test requirements, and the different modules of the audio chip cannot obtain the test results intuitively, and the effect of easy operation is achieved.

Active Publication Date: 2021-07-16
YICHIP MICROELECTRONICS (HANGZHOU) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, in the current testing process of audio chips, it is usually necessary to train professional personnel to operate the test equipment, which not only consumes too much time and labor costs in the testing process, but also cannot be intuitively obtained for different modules in the audio chip. As a result, the existing audio chip testing methods cannot meet the testing needs of users

Method used

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  • A testing method, device, electronic equipment and storage medium of an audio chip
  • A testing method, device, electronic equipment and storage medium of an audio chip
  • A testing method, device, electronic equipment and storage medium of an audio chip

Examples

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Embodiment 1

[0026] figure 1 It is a flow chart of the audio chip testing method provided by the embodiment of the present invention. This embodiment is applicable to the situation of testing the audio chip. The method can be executed by the audio chip testing device in the embodiment of the present invention. The device can Realized by means of software and / or hardware, the method of the embodiment of the present invention specifically includes the following steps:

[0027] In step S101, the audio chip to be tested is obtained, wherein the audio chip to be tested includes a plurality of project units.

[0028] Optionally, the project unit includes: Digital to Analog Converter (DAC) unit, Analog to Digital Converter (Analog to Digital Converter, ADC) unit, Bluetooth Digital to Analog Converter (BT DAC) Unit and Bluetooth Analog to Digital Converter (Bluetooth Analog to Digital Converter, BT ADC) unit.

[0029] Optionally, obtaining the audio chip to be tested may include: obtaining a doc...

Embodiment 2

[0047] figure 2 It is a flow chart of the testing method of the audio chip provided by the embodiment of the present invention. The present embodiment is based on the above-mentioned embodiment. After determining the test result of the audio chip to be tested according to the test index value, it also includes: determining the audio chip to be tested. If the test result is not passed, obtain the modification configuration instruction; according to the modification configuration instruction, modify the configuration of the project unit to be tested.

[0048] Such as figure 2 As shown, the method of the embodiment of the present disclosure specifically includes:

[0049] In step S201, the audio chip to be tested is obtained, wherein the audio chip to be tested includes a plurality of project units.

[0050] Optionally, obtaining the audio chip to be tested may include: obtaining a document corresponding to each project unit, wherein the document includes configuration inform...

Embodiment 3

[0061] image 3 It is a schematic structural diagram of a test device for an audio chip provided by an embodiment of the present invention, specifically including: an audio chip acquisition module 310 to be tested, a test index type and an item unit determination module 320 to be tested, a test index value acquisition module 330, and a test result acquisition module 340.

[0062] Wherein, the audio chip to be tested acquisition module 310 is used to acquire the audio chip to be tested, wherein the audio chip to be tested includes a plurality of project units;

[0063] The test index type and the item unit to be tested determine the module 320, which is used to determine the test index type and the item unit to be tested for the audio chip to be tested;

[0064] The test index value acquisition module 330 is used to input the audio signal into the item unit to be tested respectively, and obtain the test index value output by each item unit to be tested;

[0065] The test resu...

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Abstract

The invention discloses a testing method, device, electronic equipment and storage medium for an audio chip, comprising: obtaining the audio chip to be tested, wherein the audio chip to be tested includes a plurality of project units; determining the test index for the audio chip to be tested type and the item unit to be tested; input the audio signal into the item unit to be tested respectively, and obtain the test index value output by each item unit to be tested; determine the test result of the audio chip to be tested according to the test index value. Determine the test index type and the project unit to be tested for the audio chip to be tested, and test the selected project units in the audio chip to be tested according to the requirements, and obtain the test results of different project units of the audio chip to be tested intuitively and accurately. The entire testing process is easy to operate without consuming too much time and labor costs.

Description

technical field [0001] The embodiments of the present invention relate to the technical field of data processing, and in particular to a testing method, device, electronic equipment and storage medium of an audio chip. Background technique [0002] An audio chip needs to be configured in a true wireless stereo (True Wireless Stereo, TWS) headset to realize the function of the TWS headset. During the design process of the audio chip for TWS earphones, it is necessary to perform a performance test on the audio chip, and the subsequent mass production will only be carried out after the test is confirmed to be correct. [0003] However, in the current testing process of audio chips, it is usually necessary to train professional personnel to operate the test equipment, which not only consumes too much time and labor costs in the testing process, but also cannot be intuitively obtained for different modules in the audio chip. As a result, the existing testing methods for audio ch...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04R29/00
CPCH04R29/00
Inventor 韦平左罡何济柔
Owner YICHIP MICROELECTRONICS (HANGZHOU) CO LTD
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