Yarn thermal shrinkage rate testing device and testing method

Abstract

The invention provides a yarn thermal shrinkage rate testing device and a testing method. The yarn thermal shrinkage rate testing device comprises an upper skein twisting frame, a lower skein twistingframe, a yarn frame mechanism, a tension adjusting structure, a resistance strain gauge and an automatic length measuring instrument, wherein the upper skein twisting frame and the lower skein twisting frame are oppositely arranged; the yarn frame mechanism is rotationally connected between the upper skein twisting frame and the lower skein twisting frame and used for winding yarn, and one end ofthe yarn is connected with the upper skein twisting frame; the tension adjusting structure is arranged on the lower skein twisting frame and located between the yarn frame mechanism and the lower skein twisting frame; the resistance strain gauge is arranged on the tension adjusting structure, is connected with the other end of the yarn and is used for testing the change value of the length of theyarn along with the temperature; and the automatic length measuring instrument is connected to the yarn frame mechanism and is used for measuring the initial length of the yarn. The yarn thermal shrinkage rate testing device is simple in structure and convenient to operate, and the resistance strain gauge is arranged, so that the thermal shrinkage rate value can be rapidly and accurately measured.

Description

technical field [0001] The invention relates to the technical field of thermal shrinkage rate testing equipment, in particular to a yarn thermal shrinkage rate testing device and a testing method. Background technique [0002] Para-aramid yarn has been used in the cable industry, especially power cables. According to the thermal shrinkage and cold expansion characteristics of para-aramid yarn, it has a great influence on the performance of the cable. How to quickly and accurately detect the para-aramid yarn The thermal shrinkage rate of aramid yarn plays a very important role in guiding the design of cables. [0003] At present, the conventional test method using an oven and a scale to measure the test time is at least 3 hours, and the scale is used to measure the length. Since the change is not very obvious, the error of reading the data by the naked eye is too large, and the thermal shrinkage rate is not high. The calculations are very inaccurate and hardly reflect the re...

AI Technical Summary

Problems solved by technology

[0004] The main purpose of the present invention is to provide a yarn thermal shrinkage testing device and a testing method. The yarn thermal shrinkage testing device is simple in structure, easy to operate, and equipped with a resistance strain gauge, which can quickly and accurately measure thermal shrinkage. Rate value, in order to solve the technical problem of long test time and low accuracy of thermal shrinkage rate in the prior art

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