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High-power switch array testing device

A test device and switch array technology, applied in the field of testing, can solve the problems of system work impact, long time, time consuming, etc., and achieve the effects of high accuracy and simple test method.

Pending Publication Date: 2021-03-12
SOUTHWEST CHINA RES INST OF ELECTRONICS EQUIP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When the traditional method is used to detect the high-power devices of the switch array, the relevant systems need to be powered on to cooperate, and can only be detected one by one, which is not only time-consuming, but also affects the system work.
When the number of high-power switches is relatively large, it takes longer

Method used

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Embodiment 1

[0030] refer to Figure 1 to Figure 4 As shown, the present invention discloses a high-power switch array test device. In the figure, the test device is expressed as a switch array control box.

[0031] Preferably, the switch array control box includes a toggle switch, control lines and indicator lights arranged on each control line. The switching switch is configured to control the state switching of each switch array. One end of the control line is connected to the switching switch of the corresponding switch array, and the other end is connected to the switches in the corresponding switch array to complete the transmission of the control signals of the switches in the switch array; Completion of the corresponding switch on control is luminous. A power supply unit is externally connected to the switch array control box, and the power supply unit is configured with +28V voltage.

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Abstract

The invention discloses a high-power switch array testing device. The testing device comprises change-over switches, control circuits and indicator lamps arranged on the control circuits. The change-over switches are configured to be used for controlling the state switching of switch arrays; one end of each control circuit is connected with the change-over switch of the corresponding switch array,and the other end of each control circuit is communicated with each switch in the corresponding switch array, in order to complete the transmission of switch control signals in the switch arrays; andthe indicator lamps are configured to emit light when the control circuits successfully complete switch-on control on the corresponding switches. According to the invention, only the system cable needs to be disconnected, a switch array control box and a detection cable need to be independently connected, power-up control is carried out on the switch arrays, and the original system structure andworking mode are not changed. Whether the switch arrays break down or not is judged through on and off of the indicator lamp of the control box, switches in the switch arrays do not need to be manually detected one by one, and the testing method is simple, efficient and high in accuracy.

Description

technical field [0001] The invention belongs to the technical field of testing, in particular to a high-power switch array testing device. Background technique [0002] With the large-scale integrated use of high-power switching devices in the field of electronic technology, their reliability has become the basis for the realization of capabilities, and the rapid detection of faults is an important manifestation of equipment support capabilities. [0003] At present, with the rapid development of electronic technology, arrays of high-power switching devices are more and more widely used. As an important device for signal output, its control is mainly controlled by upper-level software, but the fault detection capability is lacking. When the traditional method is used to detect the high-power devices of the switch array, the relevant systems need to be powered on to cooperate, and they can only be detected one by one, which is not only time-consuming, but also affects the wor...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/327
CPCG01R31/327
Inventor 张杰尹朝红施会兵王俊杨永才邱婷
Owner SOUTHWEST CHINA RES INST OF ELECTRONICS EQUIP
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