Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Device for measuring deformation quantity of electrostrictive material based on Fabry-Perot cavity

A technology of electrostrictive materials and measuring devices, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of poor measurement stability, low measurement efficiency, small measurement range, etc., and achieve high precision, strong anti-interference ability, Make simple effects

Inactive Publication Date: 2021-03-02
XIAN UNIV OF TECH
View PDF3 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although these methods can accurately measure the deformation of electrostrictive materials in real time, they are bulky and easily limited by the operating level and installation environment conditions; The method has the advantages of fast speed, but this method has the problems of small measurement range and low measurement efficiency; the optical lever method has the advantages of large measurement range and fast point collection speed, but it has the problems of complex structure and poor measurement stability

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Device for measuring deformation quantity of electrostrictive material based on Fabry-Perot cavity
  • Device for measuring deformation quantity of electrostrictive material based on Fabry-Perot cavity

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] The present invention will be specifically described below in conjunction with the accompanying drawings and embodiments.

[0023] Such as Figure 1-2 As shown, a measuring device based on the deformation of the electrostrictive material in the Fappel cavity, including a base 1, a ball screw 2, a guide rail 3, a lifting controller 4, a slider 5, an optical probe 6, a fixing device 7, and an external lead Optical fiber 8, material fixture 9, material test bench 10, piezoelectric film 11; among them, the ball screw 2 and the guide rail 3 are vertically fixed on the base 1 respectively, and the two are connected by the slider 5; the fixed ball screw 2 passes through The stepping motor is connected with the lifting controller 4 to control the up and down movement of the slider 5; a material testing platform 10 is arranged on the base 1; a material fixture 9 is arranged above the material testing platform 10, and the material fixture 9 can be placed on the material testing p...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
diameteraaaaaaaaaa
Login to View More

Abstract

The invention relates to a device for measuring deformation quantity of an electrostrictive material based on a Fabry-Perot cavity. The device comprises a base and a ball screw; the ball screw and a guide rail are vertically fixed to the base and connected through a sliding block. The fixed ball screw is connected with a lifting controller through a stepping motor; a material test bench is arranged on the base; a material clamp is arranged above the material test bench; an optical probe is fixed on a connecting plate through a fixing device and is connected with an external leading-out opticalfiber, and the end surface of the optical probe faces the surface of a fixed piezoelectric film; an optical signal emitted by a laser light source is processed to form parallel light, the optical signal is incident to the piezoelectric film through the optical fiber and reflected on the upper surface of the piezoelectric film, the optical signal is transmitted to an optical demodulation system through the optical fiber, and deformation generated on the piezoelectric film is sensed through change of an optical phase. The device has the advantages of high measurement precision, simple structure, strong anti-interference capability, high response speed and small size.

Description

technical field [0001] The invention belongs to the technical field of optical fiber sensing, and in particular relates to a measuring device based on the deformation of an electrostrictive material based on a Fappel cavity. Background technique [0002] With the vigorous development of modern science and technology, more and more objects need to be controlled by using electrostrictive materials to produce micro-deformation (micron or even nano-scale), and the requirements for control precision are also getting higher and higher. Due to their excellent chemical, physical and mechanical properties, electrostrictive materials play an important role in aerospace, intelligent robots, microelectronics, artificial muscles, power systems and other fields. Such materials can produce small deformations under the condition of electricity, and convert electrical energy into mechanical energy, thereby realizing energy conversion. Therefore, the exploration and application of electrostr...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/16
CPCG01B11/18
Inventor 张嘉伟王力付庚刘朝辉
Owner XIAN UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products