Single-frame stripe image phase analysis method and system based on image denoising

Abstract

The invention discloses a single-frame fringe image phase analysis method and system based on image denoising, and the method comprises the steps: 1, carrying out the Fourier transform of a single-frame fringe image, solving the space carrier frequency of the single-frame fringe image, and converting the single-frame fringe pattern into a first to-be-denoised image and a second to-be-denoised image by using the space carrier frequency; 2, performing high-frequency denoising filtering processing on the first to-be-denoised image and the second to-be-denoised image by using a pre-trained image denoiser to obtain a first denoised image and a second denoised image; 3, calculating a truncation phase of the single-frame fringe pattern according to the obtained first denoised image and the seconddenoised image, and performing phase unwrapping of the single-frame fringe pattern according to the solved truncation phase. According to the method, the phase analysis of single-frame stripes can besimplified into one image denoising problem, the noise can be filtered only by using one image denoising device to carry out low-pass filtering, the high-precision phase analysis is realized, and thecalculation method is simple and efficient.

Description

technical field [0001] The invention relates to the field of optical three-dimensional measurement, in particular to a single-frame fringe image phase analysis method and system based on image denoising. Background technique [0002] Three-dimensional measurement based on striped structured light is a non-contact measurement method, which has many advantages, such as high precision and high speed. It is widely used in automatic processing, high-speed online detection, aerospace, physical profiling and other fields. The key to this technology is to accurately obtain phase information from the distorted fringe image, because the phase information contains the three-dimensional profile information of the measured object. [0003] The current mainstream fringe image phase analysis methods are divided into two categories, one is the phase shift method, and the other is the method based on single-frame fringes. Among them, the phase shift method needs to continuously obtain mult...

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Problems solved by technology

[0005] The purpose of the present invention is to overcome the problems of the existing single-frame fringe phase analysis method in the prior art, such as large error, low precision, poor anti-noise ability, and complicated calculation process, and provide a single-frame fringe phase analysis method based on image denoising. The frame fringe image phase analysis method and system, by solving the spatial carrier frequency of the single frame fringe image, using the space carrier frequency to convert the single frame fringe image into the first image to be denoised and the second image to be denoised; Converting the conversion of the original single-frame fringe image into a group of images to be denoised, the present invention can simplify the phase analysis of the single-frame fringe to the problem of filtering and denoising a single image, and only need to use an image denoiser to perform low-pass filtering. Noise can be filtered out to achieve high-precision phase analysis, and the calculation method is simple and efficient

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