Positioning mechanism for X-ray fluorescence spectrometer

Abstract

The invention discloses a positioning mechanism for an X-ray fluorescence spectrometer. The positioning mechanism comprises a bottom plate, a positioning assembly, a rotating assembly, a wiping assembly, a mounting assembly, a supporting assembly and a cleaning assembly. Supporting legs are fixed to the upper end face of the bottom plate, a mounting plate is fixed to the upper end faces of the supporting legs, and a fixing barrel is fixed to the upper side face of the mounting plate; the positioning assembly comprises an outer gear ring, an inner gear ring, four first gears, an extrusion blockand a rubber plate, wherein the outer gear ring is rotationally connected to the upper side face of the mounting plate and located in the mounting barrel, the inner gear ring is fixed in the outer gear ring, the four corresponding first gears are rotationally connected to the upper side face of the mounting plate, and the four first gears are meshed with the inner gear ring, so that a to-be-detected substance can be positioned, and ash on the emission mirror surface of the X-ray fluorescence spectrometer can be removed very conveniently.

Description

technical field [0001] The invention relates to the technical field of positioning mechanisms, in particular to positioning mechanisms for X-ray fluorescence spectrometers. Background technique [0002] Fluorescence spectrometer, also known as fluorescence spectrophotometer, is an instrument for qualitative and quantitative analysis. Spectrum is helpful to infer various properties of substances, and can detect solid, powder and liquid samples of different sizes and materials. Fluorescence spectrometers can be divided into X-ray fluorescence spectrometers and molecular fluorescence spectrometers. X-ray fluorescence spectrometers have important It has the characteristics of good reproducibility, fast measurement speed and high sensitivity. It can analyze all elements between F (9) and U (92). For metal, cement, ceramics, petroleum, glass and other industry samples, the non-standard semi-quantitative method can qualitatively analyze samples of various shapes, and can give semi...

AI Technical Summary

Problems solved by technology

[0002] Fluorescence spectrometer, also known as fluorescence spectrophotometer, is an instrument for qualitative and quantitative analysis. Spectrum is helpful to infer various properties of substances, and can detect solid, powder and liquid samples of different sizes and materials. Fluorescence spectrometers can be divided into X-ray fluorescence spectrometers and molecular fluorescence spectrometers. X-ray fluorescence spectrometers have important It has the characteristics of good reproducibility, fast measurement speed and high sensitivity. It can analyze all elements between F (9) and U (92). For metal, cement, ceramics, petroleum, glass and other industry samples, the non-standard semi-quantitative method can qualitatively analyze samples of various shapes, and can give semi-quantitative results. The accuracy of the results can approach the quantitative level for some samples, and the analysis time is short. , the thin film analysis software FP-MULT1 can be used for coating analysis and thin film analysis. The maximum size of the measurement sample is required to be 51mm in diameter and 40mm in height. Most of the existing X-ray fluorescence spectrometers are manually positioned when detecting substances. The substance can receive the X-rays emitted by the X-ray fluorescence spectrometer, but due to manual positioning, there will be inaccurate positioning. In this case, the detection accuracy of the X-ray fluorescence spectrometer will be reduced, and because the X-ray fluorescence spectrometer Due to the diversity of storage environments, the emission mirror is easily contaminated with more dust, which will also lead to a decrease in the accuracy of X-ray fluorescence spectrometer detection

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