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Large-size irregular sample surface scanning area identification and scanning path determination method

A scanning path and surface scanning technology, which is applied in image data processing, measuring devices, and material analysis through optical means, can solve the problems of time-consuming, reducing the efficiency of sample surface component segregation analysis, complex and cumbersome manual operations, etc., and achieve calculation The effect of fast speed, saving analysis time, and improving the efficiency of scanning analysis

Active Publication Date: 2021-02-09
NCS TESTING TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The determination of the scanning path in the scanning area is usually carried out manually, which takes about 2 hours, which greatly reduces the analysis efficiency of the composition segregation of the sample surface
Therefore, there is an urgent need for a technical method that can integrate automatic intelligent identification of scanning areas and path design, greatly improve the efficiency of scanning analysis, and solve the problems of complex and cumbersome manual operations and long time-consuming

Method used

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  • Large-size irregular sample surface scanning area identification and scanning path determination method
  • Large-size irregular sample surface scanning area identification and scanning path determination method
  • Large-size irregular sample surface scanning area identification and scanning path determination method

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Embodiment

[0090] According to the method of the present invention, the concrete steps of the present embodiment are as follows:

[0091] S1. A standard size grid plate 4 for carrying large-scale metal material to be tested samples to be tested is set on the horizontal plane mobile workbench, and an image acquisition and processing module 5 is installed on the Z axis 2; wherein, the standard size grid plate 4 The actual side length L of the square 1 It is 18.5mm; the surface of the sample to be tested is processed through the processing system 3;

[0092] S2, carry out image acquisition by the image acquisition camera of image acquisition processing module 5 for the sample to be tested, see Figure 4 , to obtain an image of the sample to be tested that contains a standardized grid background.

[0093] S3. According to the equal proportion algorithm and the actual size side length L of the grid standard 1 (the length is 18.5mm), the side length L of the square image of the standard siz...

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Abstract

The invention relates to a large-size irregular sample surface scanning area identification and scanning path determination method, which comprises the steps of setting a scanning device, processing the surface of a to-be-detected sample, obtaining an image of the to-be-detected sample by adopting an image acquisition processing module, establishing a calculation model between the real object sizeand the image by using the acquired source image, achieving automatic identification of a sample contour and an external irregular or internal cavity part through construction of multiple mathematicmodels and cumulative calculation of algorithms, and directly providing an actual scannable area of a sample and a scanning path of each row or each column in combination with parameter requirements of a scanning device. According to the method, the sample can be intelligently recognized, and the method is used for analyzing the segregation degree characterization pretreatment stage of the samplewith the area larger than 100 mm*100 mm through single-spark light source scanning.

Description

technical field [0001] The invention belongs to the technical field of material segregation analysis, in particular to a method for identifying a scanning area on the surface of a large-scale irregular sample and determining a scanning path. Background technique [0002] Intelligent recognition technology is an important technology in the information age, and its purpose is to allow computers to replace manual processing of a large amount of physical information. It is of great significance to intelligently identify the area contour of large-sized samples, determine the scannable area of ​​the sample and design the scanning path for the segregation analyzer of large-sized metal components. [0003] The large-scale metal component segregation analyzer using the spark light source as the spectral excitation source is an important means to solve the element distribution on the metal surface of large-scale components. Through sample surface processing and composition analysis, t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/01G06T7/00G06T7/13G06T7/194
CPCG01N21/01G06T7/0004G06T7/13G06T7/194Y02P90/30
Inventor 贾云海袁良经于雷张翘楚周超然董晓婉张纯岩盛亮
Owner NCS TESTING TECH
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