Universal testing device for VPX high-speed signal board

Abstract

The invention discloses a universal testing device for a VPX high-speed signal board, and relates to the field of high-speed signal acquisition of measurement and control communication and the like. According to the technical scheme, a universal computing module is adopted as a central node of star switching, and a PCIe of an X4 of a connector is connected with a core processing module to completea control function, control and state detection of the core processing module and control and monitoring of an external test instrument are realized; the core processing module interacts with the universal computer module, sends the received information to the signal processing board for processing, responding to a command of reusing the control system through single board software is made, and different function options are loaded; the core processing module takes three FPGAs connected in parallel as a core, completes analysis and distribution of control commands and transmission of signal data streams through the FPGAs, and is connected with SRIO signals of the VPX backboard to form an SRIO data transmission network for data interaction, and the FPGAs send data to each other irregularlyin a point-to-point manner.

Description

technical field [0001] The invention relates to the field of high-speed signal acquisition such as measurement and control communication, and is mainly applied to the development and integration of test equipment and ground equipment of data link terminal products. In particular, the VPX architecture high-performance signal processing test device can be applied to high-speed signal processing of aerospace and various airborne, ship-borne, and aircraft-borne equipment. Background technique [0002] With the continuous development of testing technology, the bandwidth of data transmission is also increasing. Embedded signal processing platforms have increasing requirements for system processing capability, data throughput and data transmission bandwidth. Traditional parallel shared buses such as VME and CPCI are increasingly difficult to meet the needs of future development of embedded signal processing platforms. Many application fields require synthetic aperture radar SAR to...

AI Technical Summary

Problems solved by technology

[0005] Aiming at the above-mentioned test problems such as the long time of the engineering test, the variety of board interfaces to be tested, and the high complexity of the VPX signal integrity test, the present invention provides a simple implementation, good magnetic compatibility, high versatility, fast interface test, and functional testing. VPX High Speed ​​Signal Board Universal Test Set for Coverage, Defect Diagnosis, and Performance Test Capabilities, Universal VPX High Speed ​​Signal Board Test Set

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