Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Novel nonlinear analog circuit fault diagnosis device

A technology for simulating circuit faults and diagnosing devices, applied in analog circuit testing, measuring devices, measuring device casings, etc., can solve problems such as easy damage to internal electronic components, poor heat dissipation, etc., to increase disassembly efficiency and prevent external dust. The effect of entering and increasing the service life

Pending Publication Date: 2021-01-15
GUILIN UNIV OF ELECTRONIC TECH
View PDF8 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The invention provides a new type of non-linear analog circuit fault diagnosis device, which solves the problem that a certain amount of heat will be generated during long-term use. When the heat is too high, it is easy to damage the internal electronic components. The problem of thermal cooling and poor cooling effect

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Novel nonlinear analog circuit fault diagnosis device
  • Novel nonlinear analog circuit fault diagnosis device
  • Novel nonlinear analog circuit fault diagnosis device

Examples

Experimental program
Comparison scheme
Effect test

no. 1 example

[0029] Please refer to figure 1 , figure 2 , image 3 , Figure 4 and Figure 5 ,in, figure 1 figure 1 A structural schematic diagram of the first embodiment of the new nonlinear analog circuit fault diagnosis device provided by the present invention; figure 2 for figure 1 A side view of the housing shown; image 3 for figure 1 Rear view of enclosure shown; Figure 4 for image 3 The enlarged schematic diagram of part A shown; Figure 5 for figure 1 A top view of the enclosure shown. The novel non-linear analog circuit fault diagnosis device includes: a casing 1 and a sealing plate 2;

[0030] An oscilloscope main body 3, the two sides of the oscilloscope main body 3 are fixed between the two sides of the inner wall of the housing 1, and the front of the housing 1 is movably connected with a cover plate 4;

[0031] A through hole 5, the through hole 5 is opened on the back side of the housing 1, and a cooling fan 6 is arranged inside the through hole 5;

[003...

no. 2 example

[0045] Please refer to Figure 6 , based on the novel nonlinear analog circuit fault diagnosis device provided in the first embodiment of the present application, the second embodiment of the present application proposes another novel nonlinear analog circuit fault diagnosis device. The second embodiment is only a preferred mode of the first embodiment, and the implementation of the second embodiment will not affect the independent implementation of the first embodiment.

[0046] Specifically, the difference of the novel nonlinear analog circuit fault diagnosis device provided by the second embodiment of the present application is that two fixed blocks 23 are fixedly connected to the back of the cover plate 4, and the two fixed blocks 23 are opposite to each other. A threaded rod 24 is rotationally connected between one side.

[0047] The outer surface of the threaded rod 24 is screwed with a moving plate 25 , the front of the moving plate 25 is slidably connected to the back...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a novel nonlinear analog circuit fault diagnosis device. The novel nonlinear analog circuit fault diagnosis device comprises: a shell and a sealing plate; an oscilloscope main body, wherein two sides of the oscilloscope main body are fixed between two sides of the inner wall of the shell, and the front surface of the shell is movably connected with a cover plate; and a through hole, wherein the through hole is formed in the back surface of the shell, and a cooling fan is arranged in the through hole. According to the novel non-linear analog circuit fault diagnosis deviceprovided by the invention, the oscilloscope main body can be cooled by starting the cooling fan, and external dust can be prevented from entering the oscilloscope main body by arranging the dustproofcover, so that the service life of the oscilloscope main body is prolonged, and the cooling effect is prevented from being influenced by dust attached to the cooling fan; when the dustproof cover isblocked, the dustproof cover can be detached, cleaned or replaced, the operation steps are simple, only the second connecting rod needs to be pulled, and the detaching efficiency is improved.

Description

technical field [0001] The invention relates to the field of electronic circuits, in particular to a novel nonlinear analog circuit fault diagnosis device. Background technique [0002] Analog circuits refer to circuits used to transmit, transform, process, amplify, measure and display analog signals. Analog signals are electrical signals that vary continuously. Analog circuits are the basis of electronic circuits, which mainly include amplifier circuits, signal calculation and processing circuits, oscillation circuits, modulation and demodulation circuits, and power supplies, etc., and nonlinearity in communication terms, that is, nonlinear modulation in analog modulation systems, Nonlinear modulation is also called angle modulation. The spectrum structure of the modulated signal is very different from the spectrum structure of the modulated signal. In addition to spectrum shifting, many new frequency components are added. [0003] When the existing non-linear analog circ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/316G01R1/04G01R1/02H05K7/20
CPCG01R31/316G01R1/04G01R1/02H05K7/20136H05K7/20181
Inventor 陈志炜耿建平
Owner GUILIN UNIV OF ELECTRONIC TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com