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Multi-dimensional test question evaluation method and system, and computer equipment

A multi-dimensional, test-question technology, applied in the field of education, can solve the problems of unqualified test questions, such as slow efficiency, and achieve the effect of efficient update and quality assurance

Pending Publication Date: 2021-01-05
SHENZHEN KUAIYIDIAN ELECTRONICS TECH
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Problems solved by technology

[0004] In view of the above-mentioned related technologies, the inventor believes that as the amount of questions that candidates do gradually increases, the historical test question database of candidates will gradually accumulate test questions. The defect of slow efficiency of qualified test questions

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  • Multi-dimensional test question evaluation method and system, and computer equipment
  • Multi-dimensional test question evaluation method and system, and computer equipment
  • Multi-dimensional test question evaluation method and system, and computer equipment

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Embodiment Construction

[0057] The present application will be further described in detail below with reference to the accompanying drawings.

[0058] The embodiment of the present application discloses a multi-dimensional test question evaluation method, such as figure 1 shown, wherein a multi-dimensional test item evaluation method is based on the following preprocessing steps:

[0059] Establish a user's test question bank: Input the user's identity information, and generate the identity information according to the user's identity information. According to the user's identity information, a test question bank associated with the user is established in the database, and the user's test question information is stored in the test question bank.

[0060] The specific steps of a multi-dimensional test question evaluation method include the following:

[0061] S101. Format the user's test result and store it in the user's historical test question bank.

[0062] In this embodiment, the test result inc...

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Abstract

The invention relates to a multi-dimensional test question evaluation method and system, and computer equipment. The method comprises the steps of formatting and marking a test result of a user, and storing the test result in a historical test question library of the user; examining the historical test question bank, and extracting corresponding substandard test questions according to formatted marks of the test results; analyzing the substandard test questions according to a preset evaluation standard to obtain unqualified scores of the substandard test questions; and when the disqualification score reaches a preset value, rejecting the test questions which do not reach the standard from the test question bank of the user, specifically and efficiently troubleshooting the disqualificationtest questions in the test question bank, and rejecting the disqualification test questions to ensure the quality effect of the test questions in the test question bank.

Description

technical field [0001] The application relates to the field of educational technology, in particular to a multi-dimensional examination question evaluation method, system and computer equipment. Background technique [0002] With the high development of information technology, the application of computer software and hardware combined with daily life emerges in an endless stream. Digital learning is an application that combines learning with computer software and hardware. There are tens of thousands of simulated questions, and the time for test takers to prepare for the test is often very limited, and they need to complete targeted questions in the shortest possible time. How to guide candidates to do the questions efficiently is a task that must be completed by the online question bank. One of the advantages over paper-based question banks. [0003] There are more and more existing online education applications. Every time a test taker completes a question, the correspond...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06Q10/06G06F16/215G06F16/2457
CPCG06Q10/06395G06Q10/06393G06F16/215G06F16/2457
Inventor 曹宝军
Owner SHENZHEN KUAIYIDIAN ELECTRONICS TECH
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