Offset imaging method and device for undulating surface
A technology of undulating surface and migration imaging, applied in measurement devices, seismology, geophysical measurement, etc., can solve problems such as affecting imaging accuracy
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[0026] For purposes of embodiments of the present invention, the technical solution and merits thereof more apparent, the following embodiments in conjunction with the accompanying drawings described in further detail embodiments of the present invention. In this exemplary embodiment of the present invention are used to explain the present invention but are not intended to limit the present invention.
[0027] In the description of the present specification, the "comprises", "comprising", "having", "containing" and the like, are open-ended terms, i.e., to mean including but not limited to. Reference term "one embodiment," "one embodiment," "some embodiments," "example," etc. means that a particular described feature of the exemplary embodiment or embodiments described herein, structure, or characteristic is included in at least one application of the present embodiments or examples. In the present specification, the meaning of the above term is not necessarily referred to as the s...
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