Fruit sugar degree nondestructive testing device and method based on silicon-based multispectral chip
A technology of non-destructive testing and testing devices, which is applied in the direction of measuring devices, color/spectral characteristic measurement, and material analysis through optical means. It can solve the problems of inconvenient operation of testing instruments, bulky testing system, and narrow range of testing samples. Achieve the effect of light weight, wide spectral range and fast detection speed
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0038] The present invention will be further described below in conjunction with the specific embodiments shown in the accompanying drawings.
[0039] The specific implementation of the non-destructive detection device for fruit sugar content based on silicon-based multi-spectral chip:
[0040] see figure 1 Shown is a non-destructive detection device for fruit sugar content based on a silicon-based multi-spectral chip of the present invention. A fruit support 10 is arranged above the detection device 1, and a fruit sample 4 to be tested can be placed; a light source 2 is arranged inside the detection device, and a silicon-based multi-spectral chip is used. Multispectral camera 3, detection module 5, described multispectral camera is connected with described detection module;
[0041] The multi-spectral camera 3 takes the fruit sample 4 to be measured placed on the fruit support 10 as the origin, and forms an angle θ with the light source 2;
[0042] The multispectral camera 3 ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com