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Minisatellite delivery reliability problem screening rate calculation method

A calculation method and reliability technology, applied in the direction of design optimization/simulation, special data processing applications, instruments, etc., can solve the problems of disconnection, the disconnection between the reliability prediction of the whole satellite and the development, testing and testing activities of the prototype stage.

Pending Publication Date: 2020-11-20
AEROSPACE DONGFANGHONG SATELLITE
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Problems solved by technology

[0004] The technical problem to be solved by the present invention is: to overcome the deficiencies of the prior art, solve the problem that the whole star reliability prediction is out of touch with the development, testing and test activities of the positive sample stage, and calculate the screening rate of the whole star factory reliability problem Correlating Reliability to Development Activities in the Prototype Phase of Satellites
The reliability screening rate of small satellites calculated by this method can more intuitively characterize the production reliability of satellites, solve the problem that the reliability prediction is out of touch with the actual development, testing and test activities of satellite products, and can be used for satellite development and production activities. Provide a more accurate, true and reliable evaluation function

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  • Minisatellite delivery reliability problem screening rate calculation method
  • Minisatellite delivery reliability problem screening rate calculation method
  • Minisatellite delivery reliability problem screening rate calculation method

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Embodiment

[0041] Such as figure 1 Shown is the method flowchart of the present invention, from figure 1 It can be seen that a method for calculating the screening rate of a satellite delivery reliability problem provided by the present invention, the specific steps are as follows:

[0042] (1) According to the cut-off time point T of the analysis 0According to the format of Table 1, collect the reliability problem data of the same type of small satellite models that have been launched before this point in the development stage of the prototype, and use the initial power-on time of the whole satellite in the prototype stage of each satellite as the zero point to analyze the reliability of each satellite. The relative occurrence time of sexual problems from the start power-up time of the whole star;

[0043] Table 1

[0044] serial number problem name The cumulative power-up time of the whole star when it happened (h) 1 2

[0045] (2) Superimpose the ...

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Abstract

The invention discloses a minisatellite delivery reliability problem screening rate calculation method, and belongs to the technical field of satellite overall design. The method includes: carrying out statistical analysis on reliability problems of a plurality of launched small satellites of the same type in a normal sample development stage; and obtaining delivery reliability problem distribution data and a reliability problem distribution formula of the minisatellites, substituting the accumulated power-up time of the whole satellite in the sample correction stage before delivery of the satellites into the reliability problem distribution formula, and calculating the delivery reliability problem screening rate of the satellites. The minisatellite reliability screening rate calculated bythe method can more visually represent the production reliability of the satellite, solves the problem that the reliability prediction does not exist and is disconnected with the actual development test and test activities of the satellite product, and can provide a more accurate, real and reliable evaluation effect for the satellite development and production activities.

Description

technical field [0001] The invention relates to a method for calculating the screening rate of small satellite delivery reliability problems, and belongs to the technical field of satellite overall design. Background technique [0002] The failure rate of most products shows the change characteristics of the bathtub curve in the whole life cycle. In the early life stage of product development and use, the failure rate is in a stage of rapid decline with time. This stage is called the early life stage of the product. However, the design reliability represented by reliability prediction cannot reflect this change phenomenon, and production reliability indicators such as mean time between failures or mean time between failures must be used to represent this change phenomenon, so as to control production reliability. [0003] As a product, a satellite has the characteristics of a bathtub curve in its failure rate change during its life cycle. For a satellite, the tests and expe...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/20G06F119/02
CPCG06F30/20G06F2119/02
Inventor 王世清黎明张涛王建冈
Owner AEROSPACE DONGFANGHONG SATELLITE
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