Aerosol sample injection focusing device of laser ablation plasma mass spectrometer

Abstract

The invention discloses an aerosol sample injection focusing device of a laser ablation plasma mass spectrometer. The device comprises an aerosol focalizer, a plasma mass spectrometer, an ablation pool and a laser. A sample to be ablated is placed in the ablation pool; carrier gas aerosol is conveyed into a carrier gas aerosol hose connected with the other end of the ablation pool; the carrier gasaerosol hose is connected with a gas inlet tube orifice of the aerosol focalizer and is used for oozing carrier gas; the rear end of a semi-permeable membrane tube is connected with a gas outlet tubeorifice; a sealing box surrounds the semi-permeable membrane tube to form an aerosol focalizer cavity; an electric flashboard is installed outside a gas release tube orifice to control the pressure in the aerosol focalizer cavity; and the carrier gas aerosol in a central tube enters the plasma mass spectrometer after being atomized and ionized, and a to-be-detected element in the aerosol is detected. By discharging the carrier gas, the ion concentration of the to-be-detected element entering the plasma mass spectrometer is increased, so that the sensitivity of the instrument is improved, andthe detection limit of the to-be-detected element is effectively improved under the condition that other instruments and devices are not changed.

Description

technical field [0001] The invention relates to the technical field of chemical analysis, in particular to an aerosol sampling focusing device for a laser ablation plasma mass spectrometer. Background technique [0002] Plasma mass spectrometer has become an important member of analytical instruments in the field of analytical chemistry and geochemistry due to its super strong element detection ability. Its application in environment, geology, medicine, agriculture and many other fields is more and more extensive. Due to the needs of scientific research combined with the super analysis capability of ICPMS, the technology for micro-area in-situ analysis of samples is becoming more and more mature. The instruments suitable for micro-area in-situ analysis of samples currently include electron probes, secondary particle probes, and laser ablation plasma mass spectrometry. Laser ablation-ICP-MS is an accurate and precise technique for in situ analysis of trace elements in solid...

AI Technical Summary

Problems solved by technology

However, the determination of some elements in samples with ultra-low content (such as the determination of ultra-low content of uranium and lead in quartz) is very difficult

Therefore, it is urgent to design a laser ablation plasma mass spectrometer aerosol sampling focusing device to solve the problem that low-level elements in the sample cannot be detected

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