Chip test system with chip test environment temperature detection function

Abstract

The invention discloses a chip test system with a chip test environment temperature detection function. The system comprises a test machine, a test circuit board, a test fixture, a carrying device anda thermometer; the thermometer is in communication connection with the test machine; a through hole penetrating through the inner surface and the outer surface of the test fixture is formed in the test fixture; a probe of the thermometer extends into the test fixture through the through hole to collect temperature information in the test fixture and transmit the temperature information to the test machine; and the test machine writes the temperature information into a corresponding tested chip. According to the system of the invention, the monitoring of the test environment temperature of thechip is realized, the test quality of the chip is improved, the packaging cost of a rear section is reduced, and the application quality of the chip is ensured. Moreover, the test machine writes thetemperature information into the corresponding tested chip, and the testing environment temperature of the chip can be traced back in the later period.

Description

Technical field [0001] The invention relates to the technical field of chip testing, and in particular to a chip testing system with a chip testing environment temperature detection function. Background technique [0002] After the chip is packaged in the packaging factory, the final test of the finished product (Final Test) is required. At present, the commonly used test method is to test on the chip automatic test system. At this stage, the chip automatic test system is not equipped with the function of testing the test environment temperature of the chip. It cannot monitor the test environment temperature of the chip in real time, and it cannot track the actual test environment temperature information of the chip. Later, it cannot test the chip. The ambient temperature is traced back. [0003] Therefore, there is an urgent need to provide a chip test system with a chip test environment temperature detection function to solve the above problems. Summary of the invention [0004...

AI Technical Summary

Problems solved by technology

At this stage, the chip automatic test system is not equipped with the function of testing the test environment temperature of the chip, and cannot monitor the test environment temperature of the chip in real time, and cannot track the actual test environment temperature information of the chip, and cannot test the chip later. Ambient temperature for traceability

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