Electric power system intelligent device automatic testing system

Abstract

The invention discloses an electric power system intelligent device automatic testing system, which is characterized in that a real-time simulation environment of an intelligent device is formed by using a distributed computer system, and a distributed platform architecture and a one-master multi-slave mode are established. The system is composed of a host control module and a plurality of slave execution modules, wherein the host control module mainly realizes generation, management and execution of a test script and generation of a test report; the slave execution modules simulate a test environment and realize a certain specific test task; the slave execution modules provide performance functions through corresponding host interface dynamic link library files and form an application program interface function library so as to be called by a host when the test script is executed, and command sending and data back transmission between the slave execution module and the corresponding host interface dynamic link library file are realized through a network. Application of the automatic testing system can liberate the testing personnel from dull and tedious mechanical operations, the creativity of the testing personnel are brought into full play, and the test quality and the test efficiency are improved.

Description

technical field [0001] The invention relates to the technical field of electric power testing, in particular to an automatic testing system for an electric power system intelligent device. Background technique [0002] With the improvement of automation in substations and factories, a large number of embedded intelligent devices (microcomputer relay protection and automatic measurement and monitoring devices) have been widely used in substations and factories. The application of these intelligent devices realizes unattended or less-attended substations, but at the same time it also puts forward higher requirements for its performance. However, due to some characteristics of the embedded system itself, such as real-time performance and limited memory, few I / O channels, expensive test tools, and close connection with hardware, it is very difficult to develop and test these smart devices. At present, the testing of smart devices in power systems is mainly done manually. Even i...

AI Technical Summary

Problems solved by technology

However, due to some characteristics of the embedded system itself, such as real-time performance and limited memory, few I / O channels, expensive test tools, and close connection with hardware, etc., it is very difficult to develop and test these smart devices.

At present, the testing of smart devices in the power system is mainly manual. Even if automated testing is carried out, it is only used for hardware inspection in the production process. The test function is relatively simple and fixed, and can only be used for a specific device or system.

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