Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Semiconductor laser low-temperature testing device

A technology for low-temperature testing and lasers, which is applied in semiconductor lasers, single semiconductor device testing, and optical instrument testing. It can solve problems such as unfavorable batch testing, long testing cycles, and cumbersome steps to replace devices, so as to avoid condensation and improve dehumidification. efficiency effect

Inactive Publication Date: 2020-07-03
SUZHOU EVERBRIGHT PHOTONICS CO LTD
View PDF11 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Therefore, the technical problem to be solved by the present invention is that the existing semiconductor laser low-temperature test device adopts a vacuum method to prevent condensation, and there are cumbersome steps for replacing devices, resulting in a long test cycle, which is not conducive to batch testing.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor laser low-temperature testing device
  • Semiconductor laser low-temperature testing device
  • Semiconductor laser low-temperature testing device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0054] This embodiment provides a semiconductor laser low temperature testing device, such as Figure 1 to Figure 5 As shown, it includes a low-temperature box 1, an anti-condensation assembly 2, a refrigeration device 4 and an operating part 3, wherein the low-temperature box 1 has an airtight cavity 110 for placing a laser device to be tested (not shown), and the airtight The cavity 110 has at least one first air inlet (not shown) and a first air outlet (not shown); A closed loop is formed; the refrigeration device 4 is connected to the low-temperature box 1 for cooling the laser device to be tested to reach the low temperature condition required for the test; the operating part 3 is arranged on the low-temperature box 1 for replacing the laser device to be tested to The goal of replacing the laser device to be tested without opening the sealed cavity 110 is achieved, and the test can be performed continuously, which is beneficial to batch testing.

[0055] Such as figure ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a semiconductor laser low-temperature testing device. The device comprises a low-temperature box body, a closed cavity for placing a to-be-tested laser device being arranged inthe low-temperature box body, and the closed cavity being provided with at least one first air inlet and at least one first air outlet; an anti-condensation assembly, connected with the first air inlet and the first air outlet to form a closed circulation loop; and an operating part, arranged on the low-temperature box body and used for operating and replacing the laser device to be tested. The closed cavity provides a low-temperature test environment. The interior of the closed cavity is dehumidified through the anti-condensation assembly, it is ensured that the closed cavity is in a low-water-vapor environment, and the condensation phenomenon in the testing process is avoided. Meanwhile, the operation part is arranged, the to-be-tested laser device is replaced through operation of the operation part without opening the closed cavity, the continuity of the testing process is guaranteed, batch testing is facilitated, the testing period is short, and the efficiency is high.

Description

technical field [0001] The invention belongs to the technical field of low-temperature testing equipment for laser devices, and in particular relates to a low-temperature testing device for semiconductor lasers. Background technique [0002] The performance parameter test of the laser is an important basis for judging whether the laser is good or bad. Laser performance parameters include LIV (light-current-voltage, power current voltage) characteristics, that is, Ith threshold current, Po output power, Vo operating voltage and other photoelectric characteristics. [0003] Lowering the test temperature of the laser is conducive to breaking the physical limitations of the laser and improving key performance indicators such as output power and electro-optic conversion efficiency. Researchers in the field of semiconductor lasers generally use inert gases such as liquid nitrogen or liquid helium as the primary cold source, and the PID circuit controls the temperature to control ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R31/26G01R31/00G01M11/00H01S5/00
CPCG01R31/2601G01R31/003G01M11/00H01S5/0014
Inventor 周立靳嫣然王俊梁志敏钱承吕承鹤吴天宝
Owner SUZHOU EVERBRIGHT PHOTONICS CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com