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Test instrument scheduling method under limited resource constraints

A test instrument and resource-constrained technology, applied in the field of test instrument scheduling, can solve the problems of not applying for instruments, low utilization rate of test instruments, and long test time.

Pending Publication Date: 2020-06-30
SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Application conflicts: The number of test instruments in the enterprise is limited, especially the key instruments often become the bottleneck of the test. When multiple concurrent product tests apply for the same test instrument at the same time, it is easy to cause resource conflicts
[0004] Idle instruments: Many instruments do not need to be used in the whole process of product testing. If these instruments cannot be released in time and are occupied for a long time during the whole process of product testing, other product tests that require this instrument will not be allowed because the instrument cannot be applied for. don't wait
[0005] These problems lead to low utilization of test equipment, long test time and low test efficiency

Method used

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  • Test instrument scheduling method under limited resource constraints
  • Test instrument scheduling method under limited resource constraints
  • Test instrument scheduling method under limited resource constraints

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Embodiment Construction

[0044] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0045] The constraints and assumptions are as follows:

[0046] (1) The tested product cannot be tested in advance;

[0047] (2) Only one test step can be carried out on the same test bench at the same time;

[0048] (3) A test product can only proceed to the next step after the previous step is completed;

[0049] (4) The duration of each step includes the preparation time for this step;

[0050] (5) The test instruments can be delivered to the test bench on time;

[0051] (6) Each tested product has a different importance level;

[0052] (7) The test bench will not fail during the test;

[0053] (8) A test step may require a variety of test instruments to complete the test, and limiting one step will only cause conflicts in the use of one test instrument at most.

[0054] On the basis of these conditions and assumptions, the test equip...

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Abstract

The invention relates to a test instrument scheduling method under limited resource constraints. The problem that in the actual production process, test instrument use conflicts are caused by test instrument inventory constraints is solved. A test instrument scheduling optimization model is established, wherein the model comprises a maximum completion time minimization model and a tardiness penalty cost minimization model. Constraint conditions such as limited resources are applied on the basis of model construction. An algorithm is designed for solving; test steps are scanned to overlap a time window; whether a test instrument use conflict exists or not is judged; test instruments are adjusted to solve conflicts; and a final test instrument scheduling scheme is solved. According to the test instrument scheduling method, the use conflict of the test instruments is effectively avoided, the scheduling requirement plan of the test instruments in the test process is met, and the time for waiting for the test instruments of the test bed is shortened, so that the test instrument utilization rate and the test bed processing efficiency are improved.

Description

technical field [0001] The invention belongs to the field of planning and scheduling, and specifically relates to a testing instrument scheduling method under the constraint of limited resources. Background technique [0002] Testing is an important means to ensure product quality, accumulate product research and development knowledge and enhance product competitiveness. With the increase of enterprises' independent research and development investment, enterprises rely more and more on product testing, and the amount of testing is gradually increasing. Serialized product development enables product tests to have similar characteristics, including the test process and various instruments used in the test. At the same time, in order to improve the efficiency of product development, various experiments are often carried out concurrently, such as figure 1 As shown, there is cross-use between various tests and instruments. In the course of concurrent trials, the application of...

Claims

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Application Information

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IPC IPC(8): G06Q10/06
CPCG06Q10/06312
Inventor 王戬刘文成王宇王译笙
Owner SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
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