Fault Location and Parameter Identification Method of Faulty Components in Analog Circuit

Abstract

The invention discloses an analog circuit fault location and fault element parameter identification method, which obtains the transfer function of the measuring point, analyzes the fuzzy group information of the analog circuit, determines the representative fault element of each fuzzy group, and obtains each representative fault element based on the transfer function The characteristic matrix of polynomial fitting is constructed to construct the overdetermined equations of polynomial fitting, and the coefficient vectors corresponding to each representative fault element are calculated. faults, using the genetic algorithm to identify fault component parameters. The invention can effectively realize the fault diagnosis of the analog circuit and the parameter identification of the fault element. The method has the advantages of fast positioning of the pre-test simulation and accurate parameter identification of the post-test simulation, and there is no need to store all parameter drift faults in advance.

Description

technical field [0001] The invention belongs to the technical field of analog circuit fault diagnosis, and more specifically relates to an analog circuit fault location and fault element parameter identification method. Background technique [0002] With the rapid development of integrated circuits, in order to improve product performance, reduce chip area and cost, it is necessary to integrate digital and analog components on the same chip. According to data reports, although the analog part only accounts for 5% of the chip area, its fault diagnosis cost accounts for 95% of the total diagnostic cost. Analog circuit fault diagnosis has always been a "bottleneck" problem in the integrated circuit industry. At this stage, some relatively well-developed analog circuit fault diagnosis theories have been applied to practice, such as: the fault dictionary method in the pre-test analog diagnosis method, and the component parameter identification method and fault verification method...

AI Technical Summary

Problems solved by technology

However, the fault dictionary method can only deal with discrete parameter faults and hard faults, and cannot exhaust all continuous parameter faults and parameter combinations of analog components, so it can hardly be used for parametric fault diagnosis

The post-test simulation method has disadvantages such as blindness and long simulation time

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