Method for diagnosing dynamic response of metal material

Abstract

The invention relates to a device and method for diagnosing the dynamic response of a metal material. A nanosecond laser beam emitted by a nanosecond laser source in the diagnosis device irradiates the upper surface of a to-be-detected metal sample; a picosecond laser beam emitted by a picosecond laser beam source irradiates a metal microwire backlight target to generate an X-ray source, and the X-ray source is used for carrying out X-ray diffraction imaging on the dynamic response process of the to-be-detected metal sample. A DXRD diagnosis package comprises a shielding module and an IP imaging plate, the IP imaging plate is used for recording imaging data after X-ray diffraction imaging, and the shielding module is used for shielding the influence of stray light in a backlight source ondiffraction imaging of the to-be-detected metal sample; and imaging data recorded by the IP imaging plate are used for analyzing related characteristics of the to-be-detected metal sample. According to the invention, the space-time resolution can be improved, and the diagnosis of the material dynamic response of the high-Z metal is realized.

Description

technical field [0001] The invention relates to the field of metal material diagnosis, in particular to a metal material dynamic response diagnosis device and method. Background technique [0002] Under impact loading, materials will undergo dynamic response processes such as elastic, plastic deformation, and phase transformation. These dynamic response properties of materials have become a hot research field in recent years. Researchers at home and abroad have carried out a large number of physical experimental studies by means of explosive detonation, flyer impact, high-power laser loading, etc., and developed a variety of precision diagnostic techniques with high temporal and spatial resolution, accumulating a large amount of material dynamic physical properties for people. , but there are still many deficiencies. Usually, the velocity wave profile data of the sample can be obtained by using PDV or VISAR test technology, but these test data are macroscopic and are the re...

AI Technical Summary

Problems solved by technology

However, the existing research mainly uses the X-ray source generated by the nanosecond laser loaded backlight target for dynamic X-ray diffraction diagnosis. Although this technology can obtain diffraction pattern data with high signal-to-noise ratio, its temporal and spatial resolution is low (time-resolved The rate is hundreds of ps ~ ns, the spatial resolution is hundreds of μm), and can only realize the diffraction measurement of medium and low Z metal materials (such as iron, aluminum, etc.)

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