Gas distributor in semiconductor device and semiconductor device

A gas distributor and gas distribution technology, applied in the direction of gaseous chemical plating, metal material coating process, coating, etc., can solve the problems of poor film thickness uniformity, thick edges, pipe residue, etc., to improve service life and facilitate Effect of cleaning and gas pressure equalization

Active Publication Date: 2020-06-12
BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
View PDF6 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Among them, for NH 3 , O 2 , Ar and N 2 and other reaction sources, can realize rapid transmission and purging; however, for more viscous, easy to condense and difficult to purify 2 O, TMA, TiCl 4 , PDMAT, etc., are very easy to remain in the pipeline, so that chemical vapor deposition occurs around the gas outlet of the gas outlet pipeline to form a film, which in turn leads to the phenomenon that the deposited film on the substrate is thin in the middle and thick at the edge
image 3 is a schematic diagram of the thickness distribution of a thin film deposited based on an existing gas distributor, from image 3 It can be seen that the thickness uniformity of the film is poor

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Gas distributor in semiconductor device and semiconductor device
  • Gas distributor in semiconductor device and semiconductor device
  • Gas distributor in semiconductor device and semiconductor device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0029] Specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be understood that the specific embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.

[0030] In a first aspect, an embodiment of the present invention provides a gas distributor in a semiconductor device. Optionally, the semiconductor device is a thin film deposition device. Figure 4 The top view of the gas distributor provided for the embodiment of the present invention, Figure 5 for along Figure 4 The sectional view of the line AA' in the middle, Figure 6 for along Figure 4 Sectional view of line BB' in the middle, combined with Figure 4 to Figure 6 As shown, the gas distributor includes a distributor body 110, the distributor body 110 has an air outlet end surface 111, and the distributor body 110 is provided with: a gas distribution...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
heightaaaaaaaaaa
heightaaaaaaaaaa
diameteraaaaaaaaaa
Login to view more

Abstract

The invention provides a gas distributor in a semiconductor device. The gas distributor comprises a distributor body. A gas distribution pipeline, a first gas inlet pipeline and a plurality of first gas output pipelines are arranged in the distributor body. The first gas inlet pipeline communicates with an gas inlet of the gas distribution pipeline, and the first gas outlet pipelines communicate with a plurality of gas outlets of the gas distribution pipeline in a one-to-one correspondence mode; a gas distribution cavity, a second gas inlet pipeline and a plurality of second gas outlet pipelines are further arranged in the distributor body, the gas distribution cavity is located above the gas distribution pipeline and is arranged around the first gas inlet pipeline, the height of the gas distribution cavity gradually decreases from the middle to the edge, the second gas inlet pipeline communicates with an gas inlet of the gas distribution cavity, the second gas outlet pipelines communicate with a plurality of gas outlets of the gas distribution cavity in a one-to-one correspondence mode. The first gas outlet pipelines and the second gas outlet pipelines are alternately arranged andextend to the gas outlet end surface of the distributor body. The invention further provides the semiconductor device. The uniformity of thin film deposition can be improved.

Description

technical field [0001] The invention relates to the technical field of semiconductors, in particular to a gas distributor in semiconductor equipment and the semiconductor equipment. Background technique [0002] Atomic layer deposition technology is a thin film preparation technology that is adsorbed layer by layer on the substrate in the form of a single atomic layer. The atomic layer deposition technology mainly includes two reaction processes: the first reaction process is: the first reaction precursor enters the reaction The chamber is fully adsorbed on the substrate, and after reaching saturation, the remaining reaction precursors and by-products are removed by the purge gas; the second reaction process is: the second reaction precursor enters the reaction chamber and is mixed with the already The groups adsorbed on the surface of the substrate react to release reaction by-products; after saturated adsorption is formed, the remaining reaction precursors and their by-pro...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): C23C16/455
CPCC23C16/45544C23C16/45561C23C16/45574C23C16/45578C23C16/4401
Inventor 赵雷超史小平兰云峰王勇飞秦海丰张文强纪红
Owner BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products