Image transmission processor for electronic microscope

Abstract

The invention discloses an image transmission processor for an electronic microscope. The processor comprises a DC power supply, first to seventh resistors, first to fifth capacitors, first to fourthtriodes, and a voltage stabilizing tube. Signals are input from the input end, preliminarily filtered by the first capacitor and then input into the primary amplifier composed of the first triode andthe second triode for primary amplification, and the amplified signals are stabilized by the voltage stabilizing tube, amplified by the secondary amplifier composed of the third triode and the fourthtriode and finally output after being filtered by the third capacitor. Compared with the prior art, the image transmission signal of the electron microscope is subjected to secondary filtering, the interference is effectively filtered, and the signal transmission quality is improved; meanwhile, the image transmission signal of the electron microscope is subjected to secondary amplification, the signal transmission strength is effectively improved, the signal transmission quality is guaranteed, and the popularization and application value is achieved.

Description

technical field [0001] The invention relates to an electron microscope related equipment, in particular to an electron microscope image transmission processor. Background technique [0002] Electron microscope, referred to as electron microscope, has become an indispensable and important tool in modern science and technology after more than 50 years of development. Electron microscope consists of three parts: lens barrel, vacuum device and power supply cabinet. The application of electron microscope technology is based on the optical microscope. The resolution of the optical microscope is 0.2μm, and the resolution of the transmission electron microscope is 0.2nm. That is to say, the transmission electron microscope is magnified by 1000 on the basis of the optical microscope. times. In the prior art, the electron microscope needs to output high-definition image information due to its high-precision display. However, due to the weak signal in the process of image output to t...

AI Technical Summary

Problems solved by technology

In the prior art, the electron microscope needs to output high-definition image information due to its high-precision display. However, due to the weak signal in the process of image output to the computer, it will be subject to electromagnetic wave interference or environmental interference, etc., resulting in poor image transmission data and affecting the clarity of the image. degree, therefore, there is room for improvement

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