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Grating substitute, target calibration device and calibration method based on grating spectrometer

A calibration device and target point technology, which is applied in the field of optical experiments, can solve problems affecting imaging and measurement results, grating diffraction angle errors, and low aiming and positioning accuracy, and achieve high quality, improved accuracy, and improved quality and accuracy.

Active Publication Date: 2021-03-19
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0003] The purpose of the present invention is to provide a grating substitute, a target calibration device and a calibration method based on a grating spectrometer, so as to solve the problem in the prior art that the target point positioning accuracy is not high, which easily leads to a relatively large diffraction angle of the actual grating. Large errors, technical issues that affect imaging and measurement results

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  • Grating substitute, target calibration device and calibration method based on grating spectrometer
  • Grating substitute, target calibration device and calibration method based on grating spectrometer
  • Grating substitute, target calibration device and calibration method based on grating spectrometer

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Embodiment Construction

[0037] The present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0038] The present invention provides a grating replacement such as figure 1 As shown, the grating substitute 1 includes a horizontal mounting plate 11 and a vertical reference plate 12; the horizontal mounting plate 11 is vertically installed above the vertical reference plate 12; the positioning reference plane 121 of the vertical reference plate 12 is vertically There is an upper cross wire 122 and a lower cross wire 123; the vertical reference plate 12 is made of stainless steel; the positioning reference plane 121 is a polished mirror surface, which is convenient for the alignment of the first theodolite 32; the center distance between the upper cross wire 122 and the lower cross wire 123 Calculated according to the diffraction angle of the grating, the accuracy of the center distance between the upper reticle 122 and the lower reticle 1...

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Abstract

The invention discloses a grating replacement part, a target point calibration device based on a grating spectrometer and a calibration method. The method comprises the following steps: marking a mainoptical axis and a diffraction optical axis by using a theodolite; then, using auto-collimation and axis penetration of the two theodolites, adjusting the position of the simulation target point; when the grating spectrometer works, the simulation target point being located at the overlapping point of the main optical axis and the diffraction optical axis determined by the two theodolites, the position of the simulation target point being the accurate position of the target point when the grating spectrometer works, recording the position offline by recording the aiming joint, and then performing online resetting, so that accurate aiming and positioning of the grating spectrometer on the target point can be realized. According to the target point calibration method provided by the invention, the theoretical position of the target point can be accurately calibrated in an off-line state, high-precision reset during on-line work is realized, and the target point positioning and aiming precision is improved, so that a high-quality and accurate imaging effect is obtained.

Description

technical field [0001] The invention belongs to the technical field of optical experiments, and relates to a grating substitute, a target calibration device and a calibration method based on a grating spectrometer. Background technique [0002] In optical experiments and engineering applications, the diffraction of the grating spectrometer usually requires a specific angle, and the aiming of the target point also requires high aiming accuracy. The aiming position of the target point directly affects the diffraction angle of the grating spectrometer. In general, the positioning of the target point adopts a mechanical positioning method, that is, the target point is placed at the theoretical position of the aiming by mechanical fixing, and the distance between the target point and the grating is generally measured by a length ruler. The positioning accuracy of this positioning method is poor, and it is easy to cause a large error in the diffraction angle of the actual grating,...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/02G01J3/28G01C1/02
CPCG01C1/02G01J3/0208G01J3/28
Inventor 张敏李奇王军宁薛艳博韦明智
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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