Magnetic protection device for electron microscope laboratory

A technology for electron microscopes and protective devices, which is applied in the direction of electrical components, magnetic/electric field shielding, shielding materials, etc., can solve problems such as long photographing time and unstable electron beam movement, reduce daily repair and maintenance work, and improve instrument stability Effects on Sexuality and Productivity

Inactive Publication Date: 2020-03-24
河南河大科技发展有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Generally speaking, it takes a long time to take pictures of an image of the electron microscope, so if there is interference from stray magnetic fields in the space where the electron microscope is installed, it will cause instability of the electron beam movement, and the result is a jittering image

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  • Magnetic protection device for electron microscope laboratory

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Embodiment Construction

[0011] The technical scheme of the present invention is described below with specific examples, but protection scope of the present invention is not limited thereto:

[0012] When decorating the electron microscope laboratory, magnetic shielding materials (1) are installed on the walls, roofs, floors, etc. It has been verified in practice that the effect of multiple layers of thinner antimagnetic materials is better than that of a thicker layer of antimagnetic materials. The silicon steel material has high electrical conductivity, which can guide the external magnetic field away without entering the internal space, thus effectively defending against the external low-frequency magnetic field. For high-frequency magnetic field interference, the present invention adopts an active defense method, and sets wires (4) at each front junction of the laboratory, and cooperates with the controller (5) to adjust the current passing through the wires to generate controllable The magnetic f...

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Abstract

The invention provides a magnetic protection device for a electron microscope laboratory. The magnetic protection device is suitable for the situation that the imaging effect is poor due to the fact that the installation environment of an electron microscope is often interfered by an external magnetic field. According to the magnetic protection device, a constant magnetic field space can be created and maintained in the working space of the electron microscope, so that power lines and magnetic lines in the space are uniformly distributed. By passively shielding an external magnetic field and actively adjusting an internal magnetic field, the influence of electromagnetic interference on the electron microscope is avoided or reduced, and the electromagnetic compatibility of an electron microscope experiment space is improved. The magnetic protection device comprises: a magnetic shielding material (1); a magnetic shielding frame (2); a magnetic field detector (3); a wire (4); a controller(5); ground wire (6).

Description

technical field [0001] The invention discloses a magnetic protection device for an electron microscope laboratory. Background technique [0002] The development of Electron Microscope (EM for short) has provided great convenience for scientific research, especially in the fields of submicroscopic structure and ultramicroscopic structure. With the development of science and technology, the use of electron microscopes is becoming more and more extensive. However, electron microscopes are extremely sophisticated and complex, and their installation has very strict requirements on environmental conditions. The temperature and humidity must be relatively stable and meet the requirements, and they must be anti-magnetic and shock-proof, that is, they cannot be disturbed by the surrounding magnetic field and affected by external vibrations. Each lens in an electron microscope is a closed strong magnetic field, and these lenses are very sensitive to external fluctuating stray magneti...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H05K9/00
CPCH05K9/00H05K9/0075
Inventor 张康杨艳娜李盛
Owner 河南河大科技发展有限公司
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