A Camera Binocular Photogrammetry Method Based on Small Baseline Conditions
A small baseline and conditional technology, applied in image data processing, instruments, calculations, etc., can solve problems such as low measurement accuracy and unsuitable concealment conditions
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[0064] Aiming at the shortcomings of low measurement accuracy and unrobustness of the large distortion wide-angle camera binocular photogrammetry system under small baseline conditions, the present invention provides a large distortion wide-angle camera binocular photogrammetry method based on small baseline conditions, using a small Accurate calibration technology for small-angle attitude between binocular cameras under baseline conditions, integrated calibration technology for large-distortion wide-angle cameras, fast matching technology for high-overlap images based on visual geometry, and high-precision synchronous and asynchronous fusion based on high-precision homonymous points The measurement technology greatly improves the accuracy of the photogrammetry system under covert measurement.
[0065] In order to achieve the above object, the main idea of the present invention is as follows:
[0066] Indoor high-precision stereoscopic control points are used to realize the ...
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