Test trays and sorters for electronic component testing

Abstract

The present invention relates to a test tray and a sorter for testing electronic components, which are used in testing electronic components. According to the test tray and the sorting machine for electronic component testing of the present invention, in order to move the electronic components in stages in the test area, the test tray is equipped with a separate movable loading frame for loading electronic components, and the sorting machine is configured for Step-by-step support for mobile loading frames. According to the present invention, it is possible to minimize the reduction in processing capacity even when the electronic component to be tested becomes high-specification or becomes large in size, and at the same time, it is possible to realize reuse of testers and reduce resource waste or cost burden. Effect.

Description

technical field [0001] The present invention relates to a test tray used in the testing of electronic components and a sorter for electronic component testing which moves the corresponding test tray and supports the testing of electronic components. Background technique [0002] Electronic components such as semiconductor components produced are classified into good and bad after being tested by a testing machine, and only good products are shipped. [0003] The electrical connection between the testing machine and the electronic components is realized by a sorting machine for testing electronic components (hereinafter, simply referred to as a "sorting machine"). [0004] Generally, a sorter is manufactured in various forms according to various types of electronic components to be tested. Such sorting machines can be roughly divided into whether to apply test trays or not. [0005] Some types of sorting machines have a structure in which electronic components are directly ...

AI Technical Summary

Problems solved by technology

[0013] Therefore, if during the circular movement of the test tray, the moving direction of the test tray carried out in the test section is inconsistent with the step-by-step moving direction (direction perpendicular to the moving direction of the test tray) of the electronic components used for the step-by-step test, existing technology cannot be applied

And, in this case, the first or second method above must still be adopted, which means that the above-mentioned cost burden or a large reduction in processing speed will still be incurred

Of course, since the step-by-step movement direction of electronic components is determined according to the structure of the tester, if the owner of the sorter changes the test The specification of the sorting machine solves the difficulty, but it is difficult to expect the owner to change the high-priced testing machine that is much more expensive than the sorting machine

i.e. from the owner's point of view the tester is very expensive and thus would prefer continued use rather than replacement, hence the need to replace or retrofit a sorter which is relatively less expensive than the tester

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