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Defect detection method and device, electronic device and storage medium

A defect detection and defect technology, applied in the field of image processing, can solve the problems of inaccurate detection results, large-area, low-contrast dark defects cannot effectively and completely extract the outline, and achieve the effect of overcoming low contrast

Active Publication Date: 2020-02-07
BOE TECH GRP CO LTD +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] Since the existing defect detection methods can only detect high-contrast defects, but for large-area, low-contrast dark defects, they cannot effectively and completely extract the outline, resulting in inaccurate detection results

Method used

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  • Defect detection method and device, electronic device and storage medium
  • Defect detection method and device, electronic device and storage medium

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Embodiment Construction

[0077] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0078] It should be noted that the terms "first" and "second" in the description and claims of the present invention and the above drawings are used to distinguish similar objects, but not necessarily used to describe a specific sequence or sequence. It is to be understood that the data so used are interchangeable under appropriate ...

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Abstract

The invention discloses a defect detection method and device, an electronic device and a storage medium. The method comprises the steps of correcting a target image based on a background image; segmenting the corrected target image into a plurality of local areas, and carrying out local enhancement processing on each local area; performing global enhancement processing on the target image after local enhancement processing, and performing binarization segmentation on the target image after global enhancement processing so as to extract the contour of the binarized area to be measured; and according to the outline of the binarized to-be-detected area, calculating the relative gray scale of the binarized to-be-detected area in the target image so as to carry out defect detection according tothe relative gray scale. According to the method, through local enhancement processing and global enhancement processing, large-area dark defects can be effectively extracted, so that defect detection is accurately carried out.

Description

technical field [0001] The present invention relates to the technical field of image processing, in particular to a defect detection method, device, electronic equipment and storage medium. Background technique [0002] As the semiconductor process becomes more and more complex, the process requirements for various links in the production of LCD screens are also getting higher and higher. If a certain process does not meet the predetermined requirements, there will be defects similar to "dirty". The characteristics are: large area, distributed in various places of the entire screen; low contrast, difficult for human eyes to accurately identify; various shapes, no clear shape. These screen defects have a great impact on the perception of human eyes, especially the viewing experience of dynamic scenes. In order to improve the process, the first step is to detect all the defects on the screen. [0003] Since the existing defect detection methods can only detect high-contrast ...

Claims

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Application Information

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IPC IPC(8): G06T7/40G06T7/11G06T7/00G06T5/40G06T5/00G06T3/40
CPCG06T7/0004G06T7/11G06T5/40G06T3/4007G06T7/40G06T2207/30148G06T5/70
Inventor 刘小磊王云奇彭项君赵晨曦楚明磊陈丽莉
Owner BOE TECH GRP CO LTD
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