Data acquisition and processing system of elliptic curved crystal spectrometer

Abstract

The invention discloses a data acquisition and processing system of an elliptic curved crystal spectrometer. The system comprises a CCD photoelectric conversion module, an AD application module at ananalog front end, an FPGA driving and controlling module, a USB interface transmission module and a system power supply module. The system obtains a spectral image of a laser plasma X-ray, realizes data communication with a PC through the USB interface transmission module, and displays the transmitted data on the PC. The system can acquire image data with different frame frequencies and differentresolutions in real time and at high speed, and transmit and display the acquired data in real time, and the system obtains a higher signal-to-noise ratio and a good visual effect for the spectral image by using wavelet transformation and a median filtering algorithm. The system obtains a spectral diagram of the X-ray by using the denoised spectral image, and converts the relation between pixels and light intensity into the relation between wavelength and intensity through wavelength calibration, so that the spatial resolution of the elliptic curved crystal spectrometer is obtained, and the temperature and the rotating speed of the plasma are obtained.

Description

technical field [0001] The invention relates to the field of image data collection and processing, in particular to a data collection and processing system for an elliptical curved crystal spectrometer. Background technique [0002] In high-temperature plasma, due to the abnormal high temperature and its complex electromagnetic field, various complex magnetic fluid processes and various forms of radiation are generated, and the components in the plasma experience very complicated particle and energy transport processes and various interaction processes. To truly understand the internal state and change process of high-temperature plasma, it is necessary to use certain experimental methods to analyze the temperature, density, ionization distribution, time-space distribution of current and electromagnetic field in the plasma, as well as the state of transport, fluctuation and instability. parameters are experimentally measured, i.e. plasma diagnostics. For plasma diagnostics...

AI Technical Summary

Problems solved by technology

[0003] The invention provides a data acquisition and processing system for an elliptical curved crystal spectrometer, which solves the technical problems of the existing data acquisition and transmission system in terms of sampling speed, resolution, detection accuracy and the ability to resist interference from the test environment, and realizes the present invention. The technical effect of the system's ability to improve sampling speed, resolution, detection accuracy, and resistance to test environment interference

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