Defect detection method and system based on terahertz imaging
A terahertz imaging and defect detection technology, which is applied in optical testing of defects/defects, measurement devices, and material analysis by optical means, which can solve problems such as inability to detect live working tools and internal defects of power insulators.
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[0043] In order to enable those skilled in the art to better understand the technical solutions in the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described The embodiments are only some of the embodiments of the present application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the scope of protection of this application.
[0044] see figure 1 , is a schematic flowchart of a defect detection method based on terahertz imaging provided by an embodiment of the present invention. combine figure 1 , the defect detection method in the present application comprises the following steps:
[0045] Step S110: Divide the sample to be tested into several scanning points, ...
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