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In-situ optomagnetic non-orthogonal angle measurement method based on double-beam three-axis vector atom magnetometer

A technique for in-situ measurement of atomic magnetic strength, applied to three-component magnetometers, using magneto-optical equipment for magnetic field measurement, the size/direction of magnetic fields, etc., can solve the large measurement error of three-axis magnetometer, three-axis vector The atomic magnetometer is not strictly orthogonal, and cannot be suppressed by non-orthogonal angles, etc.

Active Publication Date: 2019-12-13
BEIHANG UNIV
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Problems solved by technology

However, due to the limitation of production level and installation process, the practical three-axis vector atomic magnetometer is not strictly orthogonal, that is, there is cross-coupling in the three-axis vector atomic magnetometer, also known as non-orthogonal, which makes the three-axis magnetic intensity There is a large measurement error in the actual measurement data of the meter
Non-orthogonal angles cannot be suppressed if in-situ measurement of non-orthogonal angles is not possible

Method used

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  • In-situ optomagnetic non-orthogonal angle measurement method based on double-beam three-axis vector atom magnetometer
  • In-situ optomagnetic non-orthogonal angle measurement method based on double-beam three-axis vector atom magnetometer
  • In-situ optomagnetic non-orthogonal angle measurement method based on double-beam three-axis vector atom magnetometer

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Embodiment Construction

[0031] Below with the accompanying drawings ( figure 1 , Figure 2A , Figure 2B , image 3 ) to illustrate the present invention.

[0032] Such as figure 1 , an in-situ measuring device for optomagnetic non-orthogonal angle based on a three-axis vector atomic magnetometer with double beams includes a laser 1, a beam 2, a 1 / 2 wave plate 3, a polarization beam splitter prism 4, a convex lens 5, a convex lens 6, Mirror 7, polarization beam splitter prism 8, 1 / 4 wave plate 9, convex lens 10, photodetector 11, 1 / 2 wave plate 12, fiber coupler 13, single-mode polarization-maintaining fiber 14, collimator 15, light beam 16 , 1 / 2 wave plate 17, polarization beam splitter prism 18, convex lens 19, convex lens 20, polarization beam splitter prism 21, 1 / 4 wave plate 22, convex lens 23, photodetector 24, lock-in amplifier 25, computer 26, magnetic shield barrel 27. Three-axis magnetic compensation coil 28, non-magnetic electric heating oven 29, alkali metal gas chamber 30, and signa...

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Abstract

The invention discloses an in-situ optomagnetic non-orthogonal angle measurement method based on a double-beam three-axis vector atom magnetometer. The method can be used to reduce a system error of the three-axis vector atom magnetometer , has significance in research a new generation of ultrahigh-sensitivity three-axis magnetic field and inertia measurement device, and can be applied to magneticfield and inertia measurement in various fields in the future, especially in the aspects of physical fundamental research, geological exploration, military national defense, biomedical treatment andthe like. The method is characterized by comprising the following steps that two light beams are input into an alkali metal gas chamber in a three-axis vector atom magnetometer measuring device, the first light beam is input along the X-axis direction of the alkali metal gas chamber, and the second light beam is input along the Z-axis direction of the alkali metal gas chamber, the first and secondlight beams spin-polarize alkali metal atoms in the alkali metal gas chamber in a time-sharing manner, and non-orthogonal angle information is obtained from difference between magnetic field vector responses of the two light beams sensitive to the same axis.

Description

technical field [0001] The invention relates to the technical field of quantum instruments and measurements, in particular to an in-situ measurement method for the optical-magnetic non-orthogonal angle of a three-axis vector atomic magnetometer based on a double beam, which helps to reduce the System error is of great significance and value to the development of a new generation of ultra-high-sensitivity three-axis magnetic field measurement and inertial measurement devices, which will serve various fields in the future, especially magnetic field and inertial fields such as basic physical research, geological exploration, military defense, biomedicine, etc. measurement application. Background technique [0002] The atomic magnetometer can significantly improve the accuracy and sensitivity of magnetic field measurement, and has become the magnetometer with the highest sensitivity in magnetic measurement (theoretical sensitivity reaches aT / Hz 1 / 2 order of magnitude). Accordi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R33/02G01R33/032
CPCG01R33/0206G01R33/032
Inventor 丁铭李思然马丹跃王坤张少文蔡佳书全伟
Owner BEIHANG UNIV
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