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Three-dimensional imaging method based on error diffusion dithering algorithm

An error diffusion and dithering algorithm technology, applied in the field of imaging, can solve the problem of affecting the sine of the fringe, and achieve the effect of improving the sine and reducing the imaging error.

Inactive Publication Date: 2019-11-15
SUZHOU JIANGAO OPTOELECTRONICS TECH
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Problems solved by technology

[0009] In order to solve the problem that in the traditional error diffusion dithering algorithm, the value of the threshold leads to the continuous accumulation of quantization errors in the image processing process and affects the sinusoidality of fringes, it provides an optimization method for three-dimensional structured light imaging through threshold optimization.

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  • Three-dimensional imaging method based on error diffusion dithering algorithm
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[0040] The present invention will be further explained in detail below in conjunction with specific examples, but it should be understood that the protection scope of the present invention is not limited by the specific examples.

[0041] Such as figure 1 It is a diagram of the structured light phase shift method imaging device. In the figure, Projector represents the projector, CCD represents the image acquisition device, that is, the camera, h represents the height of the object to be measured, and L represents the height of the CCD from the standard surface. The structured light phase shift method uses a projector to emit structured light to the object to be measured, and the structured light is reflected by the object to the image acquisition device, and then various phase shift methods are used to reconstruct the three-dimensional object.

[0042] Obtain the phase information of the surface of the object to be measured by the N-step phase shift method for three-dimensiona...

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Abstract

The invention relates to a three-dimensional imaging method based on an error diffusion dithering algorithm. The method includes the following steps: acquiring a threshold value obtained based on an average gray value and an error compensation parameter in a matrix around a pixel in an error diffusion dithering algorithm; adding an original gray value of a to-be-detected pixel point to a quantization error introduced in the error diffusion process, calculating a temporary gray value of each pixel in a full image, comparing the temporary gray values with the threshold, indicating the pixel output to be 255 under the condition of being larger than the threshold by the temporary gray values, and otherwise, indicating the pixel output to be0; and carrying out defocusing on the output pixel toobtain three-dimensional imaging. On the basis of the threshold optimization method, the three-dimensional structured light imaging is optimized, so that the sinusoidal nature of the defocusing grating is improved effectively and the imaging errors are reduced.

Description

technical field [0001] The invention relates to an imaging method, in particular to a three-dimensional imaging method based on an error diffusion dithering algorithm. Background technique [0002] The structured light phase shift method plays an important role in the field of three-dimensional shape measurement because of its non-contact, fast processing and high precision characteristics. Various phase shifting methods, including three-step, four-step and N-step phase-shifting methods, are used for three-dimensional reconstruction of objects. The more the number of fringes projected by the phase-shifting method, the higher the accuracy. [0003] In the actual three-dimensional measurement process of structured light, the binary image can be used to approximate sinusoidal fringes through defocus binary encoding technology, so as to solve the influence of nonlinear effects on three-dimensional measurement. The defocus binary code only has two values ​​of 0 and 1, which does...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25G06T17/00
CPCG01B11/2527G06T17/00
Inventor 林斌孟森森
Owner SUZHOU JIANGAO OPTOELECTRONICS TECH
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