Layered optical measuring method of fruit tree vertical structure and device
A technology of vertical structure and optical measurement, which is applied in the direction of measuring devices, transmittance measurement, and analysis materials, etc., and can solve the problems of inability to obtain accurate structure information of vertical layers of fruit trees, inability to optimize evaluation of fruit tree structure light distribution and light utilization rate, and inability to optimize fruit tree structure. Shape optimization and other issues
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[0030] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0031] It should be noted that the leaf area index (LAI), as a parameter for the analysis of plant populations and community growth, has been called an important botanical parameter and evaluation index, and has been widely used in agriculture, fruit tree industry, forestry, biology, ecology and other fields. be widely used. Leaf area index (LAI)...
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