Condition-guided adversarial generation test method and system for deep neural network
A deep neural network and testing method technology, applied in the field of test case generation, can solve problems such as inability to have constraints, ignoring high-level semantics of images, waste of resources and time, etc., to achieve the effect of improving accuracy, reducing generation scale, and reducing scale
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0035] Below in conjunction with specific embodiments, the present invention will be further illustrated, and it should be understood that these embodiments are only used to illustrate the present invention and not to limit the scope of the present invention. The modifications all fall within the scope defined by the appended claims of this application.
[0036] like figure 1 As shown, a conditional guided adversarial generation test method for deep neural networks mainly includes 6 steps:
[0037] Step 1: Obtain the corresponding data set and corresponding label information of the deep neural network to be tested;
[0038] Step 2: Randomly divide the dataset into several subsets, store these subsets as batches in the batch pool, and set the joining time for each batch;
[0039] Step 3: Heuristically select batches from the batch pool, and sample a set of seed sets from the selected batches as the input of the Conditional Adversarial Generation Network (CAGN);
[0040] Step...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com