System, method and device for noise testing and life assessment of electronic components

Abstract

The invention belongs to the technical field of electronic component testing, and discloses a system, method and device for noise testing and life evaluation of electronic components, including: a main control module, an output module, a signal acquisition module, a noise signal analysis module, a circuit or a unit Noise Analysis Module. The present invention proposes a set of electronic component noise testing system devices, and on the basis of electronic component noise testing, based on noise comprehensive parameter extraction and life evaluation analysis research, innovatively proposes noise-based comprehensive parameter test extraction and device analysis. The flow of analysis methods for characterization and evaluation of life, the establishment method of life and reliability evaluation models, and the design and development of a set of noise test analysis, noise parameter extraction and electronic component life analysis and evaluation of electronic components and integrated circuit modules The system can be widely used in noise testing and life and reliability evaluation and analysis related fields of electronic components.

Description

technical field [0001] The invention belongs to the technical field of electronic component testing, and in particular relates to a system, method and device for noise testing and life evaluation of electronic components. Background technique [0002] Semiconductor electronic components are the basic units that constitute an electronic system. Any electronic module or system with complex functions is realized by the combination of various electronic components. Therefore, the quality, reliability and lifespan of electronic components also directly affect the quality, reliability and lifespan of the final functional module or system. With the increasing penetration of electronic products into human daily life, and the increasingly powerful functions and capabilities of devices, the role and impact of electronic systems are also increasing, such as motor vehicle control systems, driverless systems, and so on. People have higher and higher requirements for the reliability and ...

AI Technical Summary

Problems solved by technology

[0006] (1) The traditional aging accelerated stress life test method takes a lot of time, money and labor costs

[0007] (2) The traditional test method is destructive to the tested and analyzed components, and the tested device can no longer be used as a normal device.

[0008] (3) The accuracy and reliability of the life test evaluation of the existing method are not high

Finally, the data processing and information extraction and modeling of noisy signals must have sufficient verification tests

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