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MIPI DSI TX testing method and equipment based on FPGA

A test method and test equipment technology, applied in the FPGA-based MIPIDSITX test field, can solve problems such as difficult debugging and long test time, and achieve the effect of reducing the difficulty of hardware debugging

Inactive Publication Date: 2019-09-27
FUZHOU ROCKCHIP SEMICON
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  • Summary
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  • Claims
  • Application Information

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Problems solved by technology

[0005] For this reason, it is necessary to provide an FPGA-based MIPI DSI TX test method and equipment to solve the problem that the existing FPGA test MIPI DSI TX signal needs to pass through the conversion chip, and the registers of the conversion chip need to be configured, which is difficult to debug and takes a long time to test. The problem

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  • MIPI DSI TX testing method and equipment based on FPGA
  • MIPI DSI TX testing method and equipment based on FPGA
  • MIPI DSI TX testing method and equipment based on FPGA

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Embodiment Construction

[0036] In order to explain in detail the technical content, structural features, achieved goals and effects of the technical solution, the following will be described in detail in conjunction with specific embodiments and accompanying drawings.

[0037] see figure 1 , in this embodiment, a kind of FPGA-based MIPI DSI TX test method can be applied on a kind of FPGA-based MIPI DSI TX test equipment, described a kind of FPGA-based MIPI DSI TX test equipment, including: analysis module and Video test module.

[0038] The following is a specific description of an FPGA-based MIPI DSI TX test method:

[0039] Step S101: Receive a DSI TX signal, analyze the DSI TX signal according to the analysis protocol to obtain video-related parameters, and the video-related parameters include: video timing and video data.

[0040] Step S102: Obtain a test result by comparing the video-related parameters with predefined video-related parameters.

[0041] The FPGA is directly connected to the MI...

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Abstract

The invention relates to the field of interface testing, in particular to an MIPI DSI TX testing method and equipment based on an FPGA. The testing method comprises the following steps: receiving a DSI TX signal, and analyzing the DSI TX signal according to an analysis protocol to obtain video related parameters which comprise a video time sequence and video data; and obtaining a test result by comparing the video-related parameters with predefined video-related parameters. According to the method, the intermediate conversion chip is directly removed, so that the hardware debugging difficulty is reduced, and an extra time configuration register is not needed.

Description

technical field [0001] The invention relates to the field of interface testing, in particular to an FPGA-based MIPI DSI TX testing method and equipment. Background technique [0002] MIPI (Mobile Industry Processor Interface) is an alliance established by ARM, Nokia, ST, TI and other companies in 2003. complexity and increased design flexibility. [0003] DSI (Display Serial Interface) defines a high-speed serial interface between the processor and the display module. It is an interface specification formulated by the display working group, including TX (transmitter) and RX (receiver). Many SOC (System On Chip) manufacturers now add DSI TX as a display interface to their embedded processors, so it is necessary to test the DSI TX interface before leaving the factory. [0004] The current test method is to convert the MIPI DSI TX signal into an LVDS video signal through a conversion chip and use the FPGA to test whether the interface is correct. Such a test method not only ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N17/00
CPCH04N17/00
Inventor 黄世凯林兆强周敏心
Owner FUZHOU ROCKCHIP SEMICON
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