AOI detection machine and detection method
A testing machine, testing substrate technology, used in semiconductor/solid state device testing/measurement, conveyor objects, electrical components, etc.
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[0024] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments.
[0025] Such as Figure 1 to Figure 5 Shown: an AOI detection machine, including a detection frame 21, a detection substrate 22 is arranged on the detection frame, and a first detection transmission device 23, a second detection transmission device 24 and a similar structure are sequentially arranged on the detection substrate. The third detection transfer device 25, in this embodiment, the first detection transfer device 23 is taken as an example to describe in detail, the first detection transfer device 23 includes a first detection transfer bracket 231 arranged on the detection substrate 22, and One end of the bracket 231 is provided with a first detection transmission driving shaft 232, and a first detection transmission driving wheel 233 is respectively provided at both ends of the first detection transmission driving shaft 232, a...
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