An all-in-one optoelectronic device frequency response testing device and method

Abstract

The invention claims to protect an all-in-one optoelectronic device frequency response testing device and method. The invention is composed of a laser, a frequency-shifting heterodyne interference module, a photodetector to be tested and a spectrum analysis module, wherein the frequency-shifting heterodyne interference module is composed of an electro-optical modulator to be tested and a frequency shifter, and is respectively placed in the interference module In the upper and lower arms of Mach-Zehnder, the laser, the frequency-shifting heterodyne interference module and the photodetector to be tested are optically connected in sequence, the microwave signal source is electrically connected to the input electrode of the electro-optic modulator to be tested, and the photodetector to be tested The output terminal is electrically connected to the spectrum analysis module; when the microwave signal source is driven by two different output voltages at the same operating frequency, the power ratio of the corresponding components is obtained through the spectrum analysis module, and the power ratio of the corresponding components is obtained through the two different drives. The ratio is used to realize the frequency response test of the electro-optic modulator to be tested, and then back calculate the frequency response of the photodetector to be tested, and finally realize the self-calibration test of the frequency response.

Description

technical field [0001] The invention belongs to the technical field of optoelectronics, and in particular relates to an all-in-one optoelectronic device frequency response testing device and method. Background technique [0002] With the advent of 5G mobile communication, people's demand for communication speed and data capacity has exploded. At present, the rapid development of optical fiber communication system is the basic guarantee for the promotion of 5G mobile communication in the future. As the basic component of optical fiber communication system - optoelectronic device, its characteristic parameters are the key to determine the communication capacity, bandwidth and speed. At the same time, the realization of optoelectronic devices Accurate characterization of the characteristic parameters of the device plays a crucial role in the development, design, fabrication and optimization of optoelectronic devices, so the study of the characteristic parameters of optoelectron...

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Problems solved by technology

Among them, in the optical domain test method, the spectral analysis method can realize the measurement of the frequency response of the electro-optic modulator, (Y.Q.Shi, L.S.Yan, A.E.Willner, "High-speed electrooptic modulator characterization using optical spectrum analysis," Journal of Lightwave Technology, 2003, 21(10):2358-2367), however, the measurement accuracy of this scheme depends heavily on the resolution of the spectrum analyzer, and there are usually problems of low measurement frequency resolution and low precision. In addition, the spectral analysis method cannot realize the photodetector Frequency response test; in the electrical domain measurement method, the frequency sweep method (Y.Q.Heng, M.Xue, W.Chen, S.L.Han, J.Q.Liu, and S.L.Pan, “Large-dynamic frequency frequency measurement for broadband electro-optic phase modulators , "IEEE Photonics Technology Letters, 2019, 31(4): 291-294. D.A. Humphreys, "Integrated-optic system for high-speed photodetector bandwidth measurements," Electronics Letters, 1989, 25(23): 1555-1557.) fully Utilizing the high-precision test characteristics of vector network analyzers, high-precision relative frequency response testing of optoelectronic devices can be achieved. However, additional calibration is required and the process is complicated; the frequency-shifting heterodyne method (S.J.Zhang, C.Zhang, H.Wang , X.H.Zou, Y.L.Zhang, Y.Liu, and J.E.Bowers, "Self-calibrated microwave characterization of high-speed optoelectronic devices by heterodyne spectrum mapping," Journal of Lightwave Technology, 35(10), 1952-1961.) is using heterodyne The principle of interference, by configuring the frequency relationship of two modulation signals, achieves high-precision, self-calibrating absolute frequency response testing of optoelectronic devices. However, this solution requires an additional auxiliary broadband microwave source and broadband modulator to eliminate other components in the system. The influence of frequency response, the system pin big

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