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Open test device for thermal protector

A thermal protector and testing device technology, applied in the field of mechanical manufacturing and processing, can solve problems such as low production efficiency and affect the overall operation of equipment, and achieve the effects of improving work efficiency, ingenious design, and broad market prospects.

Pending Publication Date: 2019-08-16
SUZHOU INST OF INDAL TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The existing traditional test is only to put the workpiece into the test device for testing; in the prior art, the workpieces are put into the fixture board one by one for testing, which affects the overall operation of the equipment and also makes the production efficiency low

Method used

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  • Open test device for thermal protector
  • Open test device for thermal protector
  • Open test device for thermal protector

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Experimental program
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Embodiment Construction

[0021] In order to make the technical means, creative features, goals and effects achieved by the present invention easy to understand, the present invention will be further described below in conjunction with specific embodiments.

[0022] like Figure 1~Figure 4 As shown, it is a thermal protector opening test device of the present invention, which includes a thermal protector opening test device 30 installed on the workbench 2. The workbench 2 is provided with a turntable mechanism, and the turntable mechanism includes a The driving motor 27, the driving motor 27 includes a motor 271, a divider mechanism 272 electrically connected to the motor 271, the divider mechanism 272 is used for precise positioning, and the turntable mechanism also includes an auxiliary support arranged on the workbench 2 for supporting the turntable 21 Rod 26, auxiliary support rod 26 is pivotally connected with auxiliary runner 261; Workbench 2 is provided with a turntable 21 driven by a drive moto...

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Abstract

The present invention discloses an open test device for a thermal protector. The open test device for the thermal protector is installed on a workbench; the workbench is provided with a turntable mechanism; and the turntable mechanism is provided with a fixture plate. The open test device for the thermal protector includes a thermal protector test bracket installed on the workbench. The top of thethermal protector test bracket is provided with a first thermal protector ejection cylinder and a second thermal protector ejection cylinder mounted on the side of the thermal protector test bracket.A first thermal protector ejection rod on the first thermal protector ejection cylinder is provided with a first thermal protector test probe, and a second thermal protector ejection rod on the second thermal protector ejection cylinder is provided with a second thermal protector test probe for the thermal protector open test. A detection groove for facilitating passage of the second thermal protector test probe is provided at the position where the fixture plate is supported and fixed on the turntable mechanism. The invention provides an efficient and convenient open test device for the thermal protector.

Description

technical field [0001] The invention relates to the technical field of mechanical manufacturing and processing, in particular to a thermal protector opening test device. Background technique [0002] Existing workpiece testing and manufacturing devices are not integrated enough, and it is necessary to implement multiple inspections through multiple processes to determine the pass rate of the product. In the prior art, the operation of multiple processes in the traditional industry adopts assembly line testing. In this way, the workpiece is tested and then marked, which not only occupies the production space of the factory building, but also takes up a number of human resources, resulting in low product manufacturing efficiency. At the same time, manual operations cannot be as efficient as machines and run for a long time. It leads to product testing errors, affects the product qualification rate, increases the burden of quality inspection, and causes product loss. [0003] ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/327G01R1/02
CPCG01R31/327G01R1/02
Inventor 黄华栋单鑫鑫庄南洋王旭
Owner SUZHOU INST OF INDAL TECH
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