Method for Determining Characteristic Values of Bearing Capacity of Rammed/Compacted Fill Layer Using Shear Wave Velocity
A technology of bearing capacity eigenvalue and shear wave, applied in the field of foundation soil survey, construction, infrastructure engineering, etc., can solve problems such as large differences in physical and mechanical indicators, and achieve the effect of simple calculation method
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment example
[0081] Implementation case: Maanshan Iron and Steel Co., Ltd. Port Raw Materials Yard A~E The upper filling layer of the material strip site has been treated with dynamic compaction foundation and has been piled up during the use of many years of material strips. Due to the requirements of environmental protection upgrades and intelligent transformation, it is planned to build on the raw material strips C-type material strip, C-type material strip is particularly sensitive to settlement and deformation. For the design of C-type material strip foundation, it is necessary to provide the characteristic value of bearing capacity and deformation modulus of about 4m thick rammed (compressed) compacted filling soil layer. Due to the tight schedule, it will take a lot of time and financial resources to use the traditional load test and on-site direct shear test. Therefore, in the geotechnical engineering investigation, the characteristic value of the bearing capacity and the deformation...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com