Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Picosecond-level pulse electron beam measurement device and method based on optical transition radiation

A pulsed electron beam and measurement device technology, applied in the field of picosecond-level pulsed electron beam measurement devices, can solve the problem of high cost of streak cameras, and achieve the effect of feasible principle and simple device

Active Publication Date: 2019-08-13
NORTHWEST INST OF NUCLEAR TECH
View PDF8 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the streak camera method, the radiation is converted into Cherenkov light or OTR light, the system is relatively simple to build, but the streak camera is expensive

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Picosecond-level pulse electron beam measurement device and method based on optical transition radiation
  • Picosecond-level pulse electron beam measurement device and method based on optical transition radiation
  • Picosecond-level pulse electron beam measurement device and method based on optical transition radiation

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0051] The technical scheme of the present invention is described in more detail below in conjunction with embodiment and accompanying drawing:

[0052] The present invention proposes a scheme based on "optical transit radiation (OTR) + time-stretching drift tube + oscilloscope" to measure picosecond-level second-pulse electrons. The basic design principle of the scheme comes from the transit radiation technology and time stretching technology.

[0053] Transit radiation technology is the radiation produced by a point charge moving in a straight line at a uniform speed in an inhomogeneous medium. The spectrum of transition radiation is very wide, covering microwave, terahertz, infrared, visible light, ultraviolet and X-ray bands, among which the transition radiation in visible light band is called Optical Transition Radiation (OTR). The outstanding advantage of optical transit radiation is its fast action time, which is similar to the action time of Cerenkov radiation, both o...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a picosecond-level pulse electron beam measurement device and method based on optical transition radiation. According to the principle, based on the optical transition radiation generated by an electron beam group, a photocathode and drift tube structure is designed to realize extension of the pulse width of the optical transition radiation; and moreover, an optical signalis converted into an electric signal, an oscilloscope is utilized to measure the pulse width of the electric signal, so that optical pulse is obtained through inversion calculation, and then the length of the electron beam group is obtained. The method provides a new thought for measuring picosecond-level pulse electron beams, the blank in a relevant measurement method is filled up, and the method has obvious advantages under a specific application scene compared with an existing method.

Description

technical field [0001] The invention relates to a picosecond-level pulsed electron beam measuring device and method based on optical transit radiation. Based on the optical transit radiation generated by electron beam clusters, the optical pulse is stretched and measured through a designed drift tube structure, and then passed The length of the electron bunch is obtained by reverse calculation, and the measurement of the length of the electron bunch is realized. Background technique [0002] The measurement of the electron bunch length, especially the picosecond-level electron bunch, has always been difficult, and there are different measurement methods for different purposes and application requirements. According to research methods, the measurement of electron bunch length at home and abroad mainly includes streak camera, single photon counting method, frequency domain method, transverse deflection cavity measurement method and electro-optical sampling method. [0003] S...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01T1/29
CPCG01T1/2921
Inventor 谭新建翁秀峰魏坤黑东炜李斌康刘军张小东孙彬付竹明
Owner NORTHWEST INST OF NUCLEAR TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com