V-I graph sample data set screening method for non-invasion load monitoring
A load monitoring, non-intrusive technology, applied in the field of data screening, can solve the problems of unavailable V-I trajectory map sample data, noise interference, etc., to achieve the effect of improving recognition accuracy and recognition efficiency, and increasing the content rate
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[0044] The specific embodiments of the present invention are described below so that those skilled in the art can understand the present invention, but it should be clear that the present invention is not limited to the scope of the specific embodiments. For those of ordinary skill in the art, as long as various changes Within the spirit and scope of the present invention defined and determined by the appended claims, these changes are obvious, and all inventions and creations using the concept of the present invention are included in the protection list.
[0045] Such as figure 1 As shown, a V-I diagram sample data set screening method for non-intrusive load monitoring, including the following steps:
[0046] S1. Select electrical equipment and use it as the equipment to be tested during non-intrusive load monitoring.
[0047] S2. When the device under test enters the steady-state working mode, collect current and voltage amplitude data of all the devices under test during o...
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