Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

A method for burn-in testing of surface-mounted FETs

A test method and field effect technology, which is applied in the field of component reliability screening and testing, can solve problems such as difficulty in testing, affecting component reliability, and high rated power, so as to achieve independent temperature control and facilitate burn-in The effect of the experiment

Active Publication Date: 2021-06-08
CASIC DEFENSE TECH RES & TEST CENT
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In the existing technology, because of the high rated power of the high-power FET in the surface mount package and the poor heat dissipation of the package, it is difficult to test it. At present, most of them are in a state where the power burn-in test cannot be performed, which seriously affects the reliability of components. sex

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A method for burn-in testing of surface-mounted FETs
  • A method for burn-in testing of surface-mounted FETs
  • A method for burn-in testing of surface-mounted FETs

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0038] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0039] Aiming at the problems mentioned in the background technology, the present invention provides a surface mount FET burn-in test method, the method flow is as follows figure 1 shown.

[0040] The preparation condition of test method is: select device sample (collectively referred to in the present invention as the components and parts that prepare to carry out test and be the device to be tested), it is placed in the incubator, by lead its S pole and D pole are drawn; In the low gear of the heat dissipation mode, the preparation work for temperature measurement and heat dissipation is turned on. Concrete method steps include:

[0041] Step 101: Under different test power conditions of the device to be tested, the t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a surface-mount field effect tube aging test method, which relates to the field of reliability screening and testing of components. The method steps include: step 101: the device to be tested is located under different test power conditions, and the device to be tested is measured. The temperature value of the plastic surface of the device; Step 102: calculate the test junction temperature value; Step 103: adjust the test heat dissipation mode of the device to be tested according to the test junction temperature value of the device to be tested at this time; Step 104: judge whether the test time exceeds the set time Determine the test duration, if the set test duration is exceeded, power off to stop the test; if not, return to step 101. The invention measures the temperature value of the plastic cover of the device to be tested, and calculates the test junction temperature value of the device to be tested according to the temperature value of the plastic cover combined with the linear relationship between the test junction temperature value and power, obtains a more accurate test junction temperature value, and then adjusts the heat dissipation mode , to achieve independent temperature control, which is conducive to the aging test of power field effect tubes.

Description

technical field [0001] The invention relates to the field of reliability screening and testing of components, in particular to a surface mount field effect tube aging test method. Background technique [0002] At present, with the development of application systems, the requirements for components are getting higher and higher, and surface-mount package components with strong functions, high integration, and small size have been used more and more. Based on the domestic actual situation, most of the imported surface mount devices are industrial-grade devices, or the screening program cannot meet the reliability requirements of the application system for components. Burn-in test can shorten the early failure time of components and fully expose most of the failure mechanisms of devices, which is an effective measure to improve the reliability of devices. Therefore, it is of great significance to carry out burn-in tests on imported surface mount components to improve the relia...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26
Inventor 李硕左洪涛张凡李静杨宏兵
Owner CASIC DEFENSE TECH RES & TEST CENT
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com