Optical glass stress detecting system and detecting method

Abstract

The invention provides an optical glass stress detecting system and detecting method. The optical glass stress detecting system comprises a light source being a monochromatic light source, a first linear polarized element, a variable phase delayer, a second linear polarized element, and a detection element. The polarization direction of the first linear polarized element is perpendicular to a horizontal plane. The included angle between the fast axis direction of the variable phase delayer and the horizontal plane is 45 degrees. The polarization direction of the second linear polarized elementis parallel to the horizontal plane. The first linear polarized element, the variable phase delayer, the second linear polarized element, and the detection element are arranged successively along thelight propagation direction of the light source. A to-be-detected sample is arranged between the first linear polarized element and the variable phase delayer. Therefore, the rotation error is eliminated; the measurement precision of the phase delay is improved; and thus the precision of the optical glass stress detection is enhanced. Meanwhile, the structure of the optical glass stress detectionsystem in the prior art is simplified; the requirement on the optical element is reduced; and thus the cost is lowered.

Description

technical field [0001] The invention belongs to the field of optical detection, in particular to an optical glass stress detection system and detection method. Background technique [0002] In the production process of optical glass, due to material reasons or production processes, the glass structure will be deformed, resulting in birefringence under the action of stress, that is, stress birefringence. Therefore, by detecting the amount of phase retardation due to birefringence, the stress of the optical glass can be detected. [0003] In the prior art, a 1 / 4 wave plate method is usually used to detect the phase retardation of glass. Reference attached figure 1 , the measurement system includes a polarizer 1', a sample to be tested 2', a 1 / 4 wave plate 3' and a polarizer 4'. The light from the light source first passes through the polarizer to become linearly polarized light, then passes through the sample to be tested and becomes elliptically polarized light, and then p...

AI Technical Summary

Problems solved by technology

[0004] However, when the 1 / 4 wave plate method is used for testing, the components in the measurement system need to be rotated, which will bring errors during the rotation process and reduce the measurement accuracy of the phase delay.

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