Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Modular specimen holders for high pressure freezing and x-ray crystallography of a specimen

A sample retention and crystal diffraction technology, which is applied in the fields of high-pressure freezing of samples and X-ray crystal diffraction, can solve problems such as time-consuming, complicated, and damaged

Active Publication Date: 2019-04-16
LEICA MICROSYSTEMS GMBH
View PDF10 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This transport between different sample holders is a complex and time-consuming process and creates the risk of damage and contamination of the samples

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Modular specimen holders for high pressure freezing and x-ray crystallography of a specimen
  • Modular specimen holders for high pressure freezing and x-ray crystallography of a specimen
  • Modular specimen holders for high pressure freezing and x-ray crystallography of a specimen

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0049] In FIG. 1, a preferred embodiment of a modular sample holder with a sample holding element and an extension element according to the present invention is schematically shown, and marked as 10. Modular sample holder 10 in Figure 1a Is shown in a perspective exploded view, and in Figure 1b The three-dimensional view in the middle is shown in a composite state. The same reference numerals in the drawings indicate the same or the same elements in structure.

[0050] in Figure 1a , The two modules of the sample holder 10, namely the sample holding element 100 and the extension element 200 are shown as being separated from each other.

[0051] The sample holding element 100 includes a base element 110 and a small tube 120. The small tube 120 includes a pin 121 made of a metal material on which a holding element 122 made of polyimide, preferably Kapton, is mounted. The sample can be placed in the holding element 122. The holding element 122 is specifically configured as a sma...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
diameteraaaaaaaaaa
Login to View More

Abstract

The present invention relates to modular specimen holder (10') for high pressure freezing and / or X-ray crystallography of a specimen comprising a specimen holding element (100') and an extension element (200') connectable with each other and separable from each other; the specimen holding element (100') comprising a tubule (120') and a base element (110'), wherein the tubule (120') is adapted to hold the specimen, the base element (110') is adapted to hold the tubule (120'), wherein a distance from a bottom of the base element (110') to a top of the tubule (120') is a distance d1; the extension element (200') being adapted to be connected with the base element (110'), wherein, when the extension element (200'} and the base element (110') are connected with each other, a distance from a bottom of the extension element (200') to the top of the tubule (120') is a second distance d2; wherein the second distance d2 is larger than the first distance d1.

Description

Technical field [0001] The present invention relates to a modular sample holder for high-pressure freezing and X-ray crystal diffraction, and also relates to a method for high-pressure freezing and X-ray crystal diffraction of samples using this modular sample holder. Background technique [0002] X-ray crystal diffraction is a method of identifying the atomic and / or molecular structure of crystals. The sample is aimed by an X-ray radiation beam, which is diffracted by the crystal structure of the sample. By measuring the angle and intensity of the diffracted beam, a three-dimensional model of the electron density in the crystal can be generated. Based on this electron density, the average position of atoms in the crystal can be determined, as well as their chemical bonds, their disorder, and various other information. The X-ray radiation used for X-ray crystal diffraction can be generated, for example, by a synchrotron. [0003] X-ray crystal diffraction can be used to determin...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/20G01N1/42
CPCG01N1/42G01N23/20033G01N23/20025G01N23/20041
Inventor 赖讷·沃格利施茨韦塔·托莫瓦保罗·武尔青格海因茨·普兰克齐格弗里德·坦基
Owner LEICA MICROSYSTEMS GMBH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com