A device and method for measuring Seebeck coefficient of materials by using contrast method

Abstract

The invention relates to a device for measuring the Seebeck coefficient of a material by a comparison method. The device includes a sample stage, a heating power source and a data acquisition device. The sample stage includes a clamp, the clamp includes a lower clamp and an upper clamp, and the sample includes a standard sample and a test sample. Both the standard sample and the test sample are clamped between the lower clamp and the upper clamp, and a heating rod is installed in the lower clamp. Through the comparison between the test sample and the standard sample, the method indirectly measures the Seebeck coefficient of the material, which is convenient for comparison with the direct measurement, and avoids the problem of inaccurate temperature measurement at both ends of the sample, which is the largest error source in the measurement of the Seebeck coefficient, and The system only needs to measure the potential difference between the two ends of the test sample and the standard sample, because there is no need to measure the temperature on both sides of the sample, which greatly reduces the signal leads in the system, making the system more simple and effective. The problem of thermocouple corrosion during testing.

Description

technical field [0001] The invention relates to a thermoelectric semiconductor material performance sample stage, in particular to a device and method for measuring the Seebeck coefficient of a material by using a comparison method. Background technique [0002] The Seebeck coefficient is the inherent thermoelectric property of the material. Thermoelectric materials using the Seebeck effect are mainly used to make temperature sensors such as thermocouples, thermoelectric power generation sheets and semiconductor refrigeration sheets. Research and application are of great significance. [0003] The existing measurement device and method are as follows: the test sample is clamped between the sample stages, and the thermocouple probes A and B are in direct contact with the two ends of the sample, so as to measure the temperature of the two contact points and the temperature between the probes A and B. potential difference between them. [0004] The Seebeck coefficient of the ...

AI Technical Summary

Problems solved by technology

[0005] (1) There will be a large error in measuring the surface temperature of the sample by directly contacting the thermocouple with the sample surface, and the existing test device, the inaccurate temperature measurement is the largest source of error in the Seebeck coefficient measurement;

[0006] (2) The thermocouple and the sample will undergo corrosion reaction at high temperature, making the thermocouple invalid and unable to repeat the test

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