Illumination uniformity tester and test method

A technology of uniform illumination and testing methods, applied in photometry, optical radiation measurement, instruments, etc., can solve the problems of insufficient solar simulator uniformity analysis, increase the cost of measurement devices, increase silicon photocells, etc., to save measurement time, Effect of reducing hardware cost and improving measurement accuracy

Active Publication Date: 2019-03-26
BEIJING AEROSPACE INST OF THE LONG MARCH VEHICLE
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Problems solved by technology

The disadvantage of this structure is that it can only obtain the light intensity measurement data of 5 fixed positions, which is not enough to analyze the uniformity of the solar simulator with a large spot size
If you increase the...

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  • Illumination uniformity tester and test method
  • Illumination uniformity tester and test method

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Embodiment Construction

[0043] The characteristics and exemplary embodiments of various aspects of the present invention will be described in detail below. In order to make the purpose, technical solutions and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only configured to explain the present invention, not to limit the present invention. It will be apparent to one skilled in the art that the present invention may be practiced without some of these specific details. The following description of the embodiments is only to provide a better understanding of the present invention by showing examples of the present invention.

[0044] It should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and ...

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Abstract

The invention relates to an illumination uniformity tester and a test method. The tester comprises a sliding rail, a sliding block, an optical detector, a first motor, a second motor, a base, a controller and a data collector, wherein the first motor controls the sliding rail to rotate by taking a motor rotating shaft as a center; the motor rotating shaft is located at the light spot center of a sun simulator, and the rotating plane of the sliding rail is located at the irradiation surface of the sun simulator; the second motor controls the sliding block to move on the sliding rail along the radial direction; the controller is used for sending a motor control instruction to the first motor and the second motor; and the optical detector is installed on the sliding block and used for measuring the light intensity and sending the measured light intensity to the data collector. The tester can realize the testing for multiple measurement points in the irradiation surface by only one or twooptical detectors through combining the rotation of the sliding rail along the circumferential direction and the movement of the sliding block in the radial direction, improves the measurement accuracy and is particularly applicable to illumination uniformity testing for the sun simulator with a large light spot size.

Description

technical field [0001] The invention relates to illumination uniformity measurement technology, in particular to an illumination uniformity tester and an illumination uniformity test method. Background technique [0002] The prior art provides a solar simulator irradiation non-uniformity and instability measurement device, which includes: five silicon photocells, a test stand, a data acquisition system and a temperature control system. Among them, five silicon photovoltaic cells are installed in the left, upper, right, lower and middle positions of the test stand. The disadvantage of this structure is that it can only obtain the light intensity measurement data of five fixed positions, which is not enough to analyze the uniformity of the solar simulator with a large spot size. If the data of silicon photovoltaic cells is increased, for example, the cost of the measurement device will be increased. And there are differences in measurement between each silicon photovoltaic c...

Claims

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Application Information

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IPC IPC(8): G01J1/02G01J1/04
Inventor 孟刚李亚男南华薛莲周岩范小礼邓蓉刘鑫水涌涛刘得成赵民
Owner BEIJING AEROSPACE INST OF THE LONG MARCH VEHICLE
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