Chip relay protecting device and testing instrument and control method and connecting device thereof

Abstract

The invention provides a chip relay protecting device. The device comprises a first controller and a testing receiving switch, a first memory, a first communication module and a relay protecting module which are connected with the first controller. The device has the advantages that a preset testing template and reporting template of the device can be saved, so that the possibility that an operator makes an mistake is reduced compared with the prior art in which the operator needs to go the site to arrange the testing template and the reporting template according to the type and function of the relay protecting device, the working efficiency is improved, on-site debugging is reduced, and the use is convenient. The invention provides a chip relay protecting and a testing instrument and a controlling method and connecting device therefore which have the above advantages, and therefore further explanation is not needed.

Description

technical field [0001] The invention relates to the technical field of relay protection equipment, in particular to a chip-based relay protection device, a tester, a control method thereof, and a connector. Background technique [0002] The development of digital substation technology promotes the secondary virtual circuit to replace the traditional secondary cable circuit. The debugging of the protection device is mainly carried out by capturing and analyzing digital signals. The configuration and debugging of the protection device are more difficult and the workload is increased. The business and technical capabilities of personnel are required to increase sharply. On the other hand, digital substations have a wide variety of secondary equipment and complex secondary circuits, and the workload of on-site wiring, configuration, commissioning, and maintenance is relatively large. Equipment testing requires multi-interval equipment or even the entire station to be accompanied...

AI Technical Summary

Problems solved by technology

When the secondary equipment is replaced, the debugging is complicated, the debugging time is long, and the power failure time of the primary equipment is long

[0007] In the existing technology, there are many links that require manual intervention in the test preparation stage, usually requiring a lot of preparatory work (such as setting various parameters, selecting and adjusting test cases, maintaining report templates, debugging wiring, etc.), and the degree of automation is not high.

Secondly, the entire test system is usually composed of a notebook or PC host, special automatic test accessories, testers, and switches. Multiple factors such as cross work sites and the skills of commissioning and maintenance personnel cannot meet the requirements for on-site maintenance and commissioning of substation operations

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