A method for evaluating the the overall roughness of the surface of three-dimensional irregular particles

A particle surface, irregular technology, applied in image analysis, instrumentation, calculation, etc., can solve problems such as the inability to evaluate the overall roughness of the entire particle, and the inability to consider the influence of the three-dimensional irregular particle geometry.

Active Publication Date: 2019-02-26
SHENZHEN UNIV
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Problems solved by technology

[0014] (1) For three-dimensional irregular particles, current methods such as the stylus method and interferometry can only measure the local roughness of the particle surface, but cannot evaluate the overall roughness of the entire particle;
[0015] (2) The current roughness evaluation methods and indicators can only consider the influence of local geometric features, but cannot consider the influence of the overall geometry of three-dimensional irregular particles

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  • A method for evaluating the the overall roughness of the surface of three-dimensional irregular particles
  • A method for evaluating the the overall roughness of the surface of three-dimensional irregular particles
  • A method for evaluating the the overall roughness of the surface of three-dimensional irregular particles

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Embodiment Construction

[0050] The present invention will be further described below in conjunction with the description of the drawings and specific embodiments.

[0051] like Figure 1 to Figure 4 As shown, the present invention relates to a method for evaluating the overall surface roughness of three-dimensional irregular particles, which is used for scientific, objective and rapid evaluation of the overall surface roughness of irregular three-dimensional particles.

[0052] The main steps of a method for evaluating the overall surface roughness of three-dimensional irregular particles proposed by the present invention are as follows:

[0053] (1) Use a high-resolution 3D scanner to scan 3D irregular particles to obtain point cloud data on the surface of the particles (not less than 100,000 points per particle), such as figure 1 shown;

[0054] (2) The current roughness evaluation method can only measure and analyze the roughness of the local surface of the particle, but cannot evaluate the over...

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Abstract

The invention provides a method for evaluating the overall roughness of the surface of three-dimensional irregular particles, comprising the following steps: S1, scanning the three-dimensional irregular particles by a three-dimensional scanner to obtain the point cloud data of the surface of the particles; S2, carrying out 3D geometrical reconstruction of the particle surface by using the coordinates of the particle surface points obtained by scanning with the spherical harmonic function with the highest degree n=25, using the reconstructed virtual particles as the reference smooth particles,and evaluating the overall roughness of the particles based on the difference between the real particles and the reference particles; S3, using the reconstructed virtual particles as the reference smooth particles, evaluating the roughness of the real particles based on the volume enclosed between the actual particle surface and the reference particle surface and the reference particle surface area. The invention has the advantages that the whole roughness of the whole particle can be evaluated; The influence of the whole geometry of three-dimensional irregular particles can be considered.

Description

technical field [0001] The invention relates to the evaluation of surface roughness, in particular to a method for evaluating the overall surface roughness of three-dimensional irregular particles. Background technique [0002] Surface roughness refers to the unevenness of small pitches and tiny peaks and valleys on the surface of an object. The distance (wave distance) between the two peaks or two troughs is very small (below 1mm). The smaller the surface roughness, the smoother the surface. [0003] In order to study the influence of surface roughness on the performance of parts and the need to measure the microscopic unevenness of the surface, from the late 1920s to the 1930s, some experts in Germany, the United States and the United Kingdom designed and produced optical microscopes such as optical section microscopes and interference microscopes. The instrument used to measure the microscopic roughness of the surface by using this method creates the conditions for quan...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T17/00
CPCG06T7/0002G06T17/00
Inventor 苏栋江月琴
Owner SHENZHEN UNIV
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